Patent Assignment
Reel/Frame 062164/0438
Assignment of Assignor's Interest
Recorded: 2022-12-20
Pages: 4
Assignor
SPAMPINATO, CONCETTO
Executed: 2022-12-15
Assignee
UNIVERSITA' DEGLI STUDI DI CATANIA - DIPARTIMENTO DI INGEGNERIA ELETTRICA ELETTRONICA E INFORMATICA (DIEEI)
VIALE ANDREA DORIA 6, CATANIA (CT), 95125, ITALY
Covered Property
(1)
Machine Learning Techniques for Wafer Defect Map Classification
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 20, 2022
From: RUNDO, FRANCESCO; COFFA, SALVATORE; SARPIETRO, RICCARDO EMANUELE; GIUFFRE', PAOLA CARMELINA
To: STMICROELECTRONICS S.R.L.
Reel/Frame 062164/0244 →
Assignment of Assignor's Interest
May 16, 2023
From: UNIVERSITA' DEGLI STUDI DI CATANIA
To: STMICROELECTRONICS S.R.L.
Reel/Frame 063652/0812 →
Assignment of Assignor's Interest
Oct 17, 2024
From: STMICROELECTRONICS S.R.L.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 069180/0793 →