Patent Assignment
Reel/Frame 063652/0812
Assignment of Assignor's Interest
Recorded: 2023-05-16
Pages: 5
Assignor
UNIVERSITA' DEGLI STUDI DI CATANIA
Executed: 2023-03-03
Assignee
STMICROELECTRONICS S.R.L.
VIA C. OLIVETTI, 2, AGRATE BRIANZA (MB), 20864, ITALY
Covered Property
(1)
Machine Learning Techniques for Wafer Defect Map Classification
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 20, 2022
From: RUNDO, FRANCESCO; COFFA, SALVATORE; SARPIETRO, RICCARDO EMANUELE; GIUFFRE', PAOLA CARMELINA
To: STMICROELECTRONICS S.R.L.
Reel/Frame 062164/0244 →
Assignment of Assignor's Interest
Dec 20, 2022
From: SPAMPINATO, CONCETTO
To: UNIVERSITA' DEGLI STUDI DI CATANIA - DIPARTIMENTO DI INGEGNERIA ELETTRICA ELETTRONICA E INFORMATICA (DIEEI)
Reel/Frame 062164/0438 →
Assignment of Assignor's Interest
Oct 17, 2024
From: STMICROELECTRONICS S.R.L.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 069180/0793 →