IP Library › Assignment 066348/0079
Patent Assignment
Reel/Frame 066348/0079

Assignment of Assignor's Interest

Recorded: 2024-02-05 Pages: 5
Assignors
WOJEK, CHRISTIAN
Executed: 2023-09-12
SRIKANTHA, ABHILASH
Executed: 2023-09-06
Assignee
CARL ZEISS AG
CARL-ZEISS-STRASSE 22, OBERKOCHEN, 73447, GERMANY
Covered Property (1)
Automated Root Cause Analysis for Defect Detection During Fabrication Processes of Semiconductor Structures
Application: 17/034,640 →
Publication: US 2021/0097673
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 5, 2024
From: NEUMANN, JENS TIMO; FOCA, EUGEN; KORB, THOMAS; CORREA, JOAQUIN
To: CARL ZEISS SMT GMBH
Reel/Frame 066347/0961 →
Assignment of Assignor's Interest Feb 5, 2024
From: PICHUMANI, RAMANI
To: CARL ZEISS SBE, LLC
Reel/Frame 066348/0204 →
Assignment of Assignor's Interest Feb 5, 2024
From: CARL ZEISS SBE, LLC
To: CARL ZEISS SMT GMBH
Reel/Frame 066348/0299 →
Assignment of Assignor's Interest Feb 5, 2024
From: CARL ZEISS AG
To: CARL ZEISS SMT GMBH
Reel/Frame 066348/0340 →