IP Library Assignment 066348/0204
Patent Assignment
Reel/Frame 066348/0204

Assignment of Assignor's Interest

Recorded: 2024-02-05 Pages: 3
Assignor
PICHUMANI, RAMANI
Executed: 2023-11-07
Assignee
CARL ZEISS SBE, LLC
ONE ZEISS DRIVE, THORNWOOD, NEW YORK, 10594
Covered Property (1)
Automated Root Cause Analysis for Defect Detection During Fabrication Processes of Semiconductor Structures
Application: 17/034,640 →
Publication: US 2021/0097673
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 5, 2024
From: NEUMANN, JENS TIMO; FOCA, EUGEN; KORB, THOMAS; CORREA, JOAQUIN
To: CARL ZEISS SMT GMBH
Reel/Frame 066347/0961 →
Assignment of Assignor's Interest Feb 5, 2024
From: WOJEK, CHRISTIAN; SRIKANTHA, ABHILASH
To: CARL ZEISS AG
Reel/Frame 066348/0079 →
Assignment of Assignor's Interest Feb 5, 2024
From: CARL ZEISS SBE, LLC
To: CARL ZEISS SMT GMBH
Reel/Frame 066348/0299 →
Assignment of Assignor's Interest Feb 5, 2024
From: CARL ZEISS AG
To: CARL ZEISS SMT GMBH
Reel/Frame 066348/0340 →