Granted Patent
Utility
US 6,515,495
· Confirmation No. 2159
TEST STRUCTURE IN AN INTEGRATED SEMICONDUCTOR
Inventor:
Frank Richter
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-02-26 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-02-26 | SPEC |
Specification | 12 | View | |
| 2001-02-26 | CLM |
Claims | 4 | View | |
| 2001-02-26 | ABST |
Abstract | 1 | View | |
| 2001-02-26 | DRW |
Drawings-only black and white line drawings | 3 | View | |
| 2001-02-26 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Frank Richter
Dresden, GERMANY
Attorneys & Agents of Record
Classification
USPC
324/754
H10P74/277
H10P74/00
Prosecution
- Examiner
- TANG, MINH NHUT
- Art Unit
- 2829
- Docket No.
- GR 00 P 4035
- Confirmation No.
- 2159
Foreign Priority
100 10 285.9
·
2000-02-25
·
GERMANY
Publication
- Pub. No.
- US20010022360A1
- Pub. Date
- 2001-09-20
Patent Term Adjustment
-13days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2015-09-03
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Quick Facts
- Patent No.
- US 6,515,495
- App. No.
- 09/793,353
- Filed
- 2001-02-26
- Granted
- 2003-02-04
- Pub. No.
- US20010022360A1
- Examiner
- TANG, MINH NHUT
- Art Unit
- 2829
- PTA
- -13 days
External Links