Granted Patent
Utility
US 6,612,738
· Confirmation No. 8741
METHOD FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTOR CHIP AND SEMICONDUCTOR CHIP WITH TEMPERATURE MEASURING CONFIGURATION
Inventors
Attorneys & Agents of Record
Classification
USPC
374/183
Prosecution
- Examiner
- DEJESUS, LYDIA M
- Art Unit
- 2859
- Docket No.
- GR 00 P 1468
- Confirmation No.
- 8741
Foreign Priority
100 11 179.3
·
2000-03-08
·
GERMANY
Publication
- Pub. No.
- US20010026576A1
- Pub. Date
- 2001-10-04
Patent Term Adjustment
-34days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2015-09-03
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-06-13
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Quick Facts
- Patent No.
- US 6,612,738
- App. No.
- 09/801,963
- Filed
- 2001-03-08
- Granted
- 2003-09-02
- Pub. No.
- US20010026576A1
- Examiner
- DEJESUS, LYDIA M
- Art Unit
- 2859
- PTA
- -34 days
External Links