Granted Patent
Utility
US 6,445,630
· Confirmation No. 6118
METHOD FOR CARRYING OUT A BURN-IN PROCESS FOR ELECTRICALLY STRESSING A SEMICONDUCTOR MEMORY
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-05-07 | A.PE |
Preliminary Amendment | 19 | View | |
| 2001-03-23 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-03-23 | SPEC |
Specification | 11 | View | |
| 2001-03-23 | CLM |
Claims | 2 | View | |
| 2001-03-23 | ABST |
Abstract | 1 | View | |
| 2001-03-23 | DRW |
Drawings-only black and white line drawings | 3 | View | |
| 2001-03-23 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Kamel Ayadi
Puchheim, GERMANY
Jurgen Lindolf
Friedberg, GERMANY
Nedim Oezoguz-Geissler
Taufkirchen, GERMANY
Attorneys & Agents of Record
Classification
USPC
365/201
Prosecution
- Examiner
- HOANG, HUAN
- Art Unit
- 2818
- Docket No.
- GR 00 P 1581
- Confirmation No.
- 6118
Foreign Priority
100 14 388.1
·
2000-03-23
·
GERMANY
Publication
- Pub. No.
- US20010033518A1
- Pub. Date
- 2001-10-25
Patent Term Adjustment
-12days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2015-09-03
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-07-23
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Quick Facts
- Patent No.
- US 6,445,630
- App. No.
- 09/816,924
- Filed
- 2001-03-23
- Granted
- 2002-09-03
- Pub. No.
- US20010033518A1
- Examiner
- HOANG, HUAN
- Art Unit
- 2818
- PTA
- -12 days
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