Granted Patent
Utility
US 6,584,592
· Confirmation No. 6584
SEMICONDUCTOR TESTING APPARATUS FOR TESTING SEMICONDUCTOR DEVICE INCLUDING BUILT IN SELF TEST CIRCUIT
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-05-21 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-05-21 | SPEC |
Specification | 10 | View | |
| 2001-05-21 | CLM |
Claims | 2 | View | |
| 2001-05-21 | ABST |
Abstract | 1 | View | |
| 2001-05-21 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2001-05-21 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
714/733
Prosecution
- Examiner
- CHUNG, PHUNG M
- Art Unit
- 2133
- Docket No.
- 57454-107
- Confirmation No.
- 6584
Foreign Priority
10-168450(P)
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1998-06-16
·
JAPAN
Publication
- Pub. No.
- US20010021988A1
- Pub. Date
- 2001-09-13
Patent Term Adjustment
-45days
MERGER
Recorded 2015-04-03
MERGER
Recorded 2015-04-03
CHANGE OF NAME
Recorded 2015-04-03
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2015-04-03
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2011-03-18
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Quick Facts
- Patent No.
- US 6,584,592
- App. No.
- 09/860,608
- Filed
- 2001-05-21
- Granted
- 2003-06-24
- Pub. No.
- US20010021988A1
- Examiner
- CHUNG, PHUNG M
- Art Unit
- 2133
- PTA
- -45 days
External Links