IP Library Granted Patent US 6,370,069
Granted Patent Utility
US 6,370,069 · Confirmation No. 5881

Method for testing a multiplicity of word lines of a semiconductor memory configuration

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Code Description Pages PDF
2001-05-29 TRNA Transmittal of New Application 1 View
2001-05-29 SPEC Specification 8 View
2001-05-29 CLM Claims 2 View
2001-05-29 ABST Abstract 1 View
2001-05-29 DRW Drawings-only black and white line drawings 1 View
2001-05-29 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,370,069
App. No.
09/867,254
Filed
2001-05-29
Granted
2002-04-09
Pub. No.
US20010048621A1
Examiner
MAI, SON LUU
Art Unit
2818
PTA
0 days