IP Library Patent Application 09907693
Patent Application Utility
App. No. 09/907,693 · Confirmation No. 5997

SYSTEM FOR TESTING FAST INTEGRATED DIGITAL CIRCUITS, IN PARTICULAR SEMICONDUCTOR MEMORY MODULES

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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Code Description Pages PDF
2004-02-20 IFEE Issue Fee Payment (PTO-85B) 1 View
2001-07-18 TRNA Transmittal of New Application 1 View
2001-07-18 SPEC Specification 15 View
2001-07-18 CLM Claims 13 View
2001-07-18 ABST Abstract 1 View
2001-07-18 DRW Drawings-only black and white line drawings 1 View
2001-07-18 OATH Oath or Declaration filed 4 View
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Quick Facts
App. No.
09/907,693
Filed
2001-07-18
Granted
2004-04-13
Pub. No.
US20020010877A1
Art Unit
2184
PTA
-3 days