IP Library Granted Patent US 6,562,185
Granted Patent Utility
US 6,562,185 · Confirmation No. 9817

WAFER BASED TEMPERATURE SENSORS FOR CHARACTERIZING CHEMICAL MECHANICAL POLISHING PROCESSES

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Code Description Pages PDF
2001-09-18 TRNA Transmittal of New Application 3 View
2001-09-18 SPEC Specification 26 View
2001-09-18 CLM Claims 6 View
2001-09-18 ABST Abstract 1 View
2001-09-18 DRW Drawings-only black and white line drawings 15 View
2001-09-18 OATH Oath or Declaration filed 3 View
2001-09-18 LET. Miscellaneous Incoming Letter 1 View
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Quick Facts
Patent No.
US 6,562,185
App. No.
09/955,552
Filed
2001-09-18
Granted
2003-05-13
Pub. No.
US20030055526A1
Art Unit
1763
PTA
0 days