IP Library › Granted Patent US 6,788,400
Granted Patent Utility
US 6,788,400 · Confirmation No. 2180

METHOD AND APPARATUS FOR DETECTING ABERRATIONS IN AN OPTICAL SYSTEM

Inventor: J. Fung Chen
Patented Case View Patent ↗ View Publication ↗
⬇ PDF
 Code Description Pages PDF
2004-07-29 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-04-30 NOA Notice of Allowance and Fees Due (PTOL-85) 7 View
2004-04-30 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-04-30 SRFW Search information including classification, databases and other search related notes 1 View
2004-04-30 FWCLM Index of Claims 1 View
2004-04-29 SRNT Examiner's search strategy and results 1 View
2004-04-15 A.NE Response After Final Action 1 View
2004-04-15 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2004-04-15 DIST Terminal Disclaimer 3 View
2004-01-15 CTFR Final Rejection 5 View
2004-01-15 FWCLM Index of Claims 1 View
2004-01-15 SRFW Search information including classification, databases and other search related notes 1 View
2003-11-25 WFEE Fee Worksheet (SB06) 1 View
2003-11-25 FWCLM Index of Claims 1 View
2003-10-27 A... Amendment/Request for Reconsideration-After Non-Final Rejection 3 View
2003-10-27 CLM Claims 7 View
2003-10-27 REM Applicant Arguments/Remarks Made in an Amendment 6 View
2003-10-27 DRW Drawings-only black and white line drawings 3 View
2003-10-27 XT/ Extension of Time 1 View
2003-06-27 CTNF Non-Final Rejection 8 View
2003-06-27 892 List of references cited by examiner 1 View
2003-04-21 A... Amendment/Request for Reconsideration-After Non-Final Rejection 2 View
2003-04-21 CLM Claims 3 View
2003-04-21 REM Applicant Arguments/Remarks Made in an Amendment 10 View
2002-11-19 CTNF Non-Final Rejection 6 View
2002-11-19 892 List of references cited by examiner 1 View
2002-11-19 1449 List of References cited by applicant and considered by examiner 1 View
2002-11-14 SRNT Examiner's search strategy and results 1 View
2002-03-26 PEFR Applicant Response to Pre-Exam Formalities Notice 5 View
2002-03-26 OATH Oath or Declaration filed 4 View
2002-03-26 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
2002-03-26 FOR Foreign Reference 1 View
2002-03-26 FOR Foreign Reference 1 View
2002-03-26 XT/ Extension of Time 1 View
2002-03-26 FOR Foreign Reference 56 View
2002-03-26 FOR Foreign Reference 38 View
2002-03-26 FOR Foreign Reference 52 View
2002-03-26 FOR Foreign Reference 24 View
2002-01-28 PEFN Pre-Exam Formalities Notice 1 View
2001-12-04 TRNA Transmittal of New Application 1 View
2001-12-04 A.PE Preliminary Amendment 2 View
2001-12-04 SPEC Specification 21 View
2001-12-04 CLM Claims 3 View
2001-12-04 ABST Abstract 1 View
2001-12-04 DRW Drawings-only black and white line drawings 11 View
2001-12-04 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2001-12-04 SRFW Search information including classification, databases and other search related notes 1 View
2001-12-04 FWCLM Index of Claims 1 View
2001-12-04 TRNA Transmittal of New Application 2 View
2001-12-04 DRW Drawings-only black and white line drawings 11 View
2001-12-04 SPEC Specification 21 View
2001-12-04 CLM Claims 3 View
2001-12-04 ABST Abstract 1 View
2001-12-04 WFEE Fee Worksheet (SB06) 1 View
2001-12-04 WCLM Claims Worksheet (PTO-2022) 1 View
2001-12-04 A.PE Preliminary Amendment 1 View
2001-12-04 REM Applicant Arguments/Remarks Made in an Amendment 1 View
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
Patent No.
US 6,788,400
App. No.
10/001,196
Filed
2001-12-04
Granted
2004-09-07
Pub. No.
US20020088951A1
Examiner
NGUYEN, TU T
Art Unit
2877
PTA
-91 days