IP Library › Granted Patent US 6,500,713
Granted Patent Utility
US 6,500,713 · Confirmation No. 5759

METHOD FOR REPAIRING DAMAGE TO CHARGE TRAPPING DIELECTRIC LAYER FROM BIT LINE IMPLANTATION

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 Code Description Pages PDF
2001-12-20 TRNA Transmittal of New Application 3 View
2001-12-20 SPEC Specification 5 View
2001-12-20 CLM Claims 2 View
2001-12-20 ABST Abstract 1 View
2001-12-20 DRW Drawings-only black and white line drawings 3 View
2001-12-20 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,500,713
App. No.
10/023,349
Filed
2001-12-20
Granted
2002-12-31
Examiner
LE, DUNG ANH
Art Unit
2818
PTA
-54 days