IP Library Granted Patent US 6,936,896
Granted Patent B2
US 6,936,896 · App. 10/027,911 · Granted Aug 30, 2005

Semiconductor apparatus

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Quick Facts
Patent No.
US 6,936,896
App. No.
10/027,911
Granted
Aug 30, 2005
Kind
B2
Abstract

A low voltage thyristor is disclosed that can be used to provide protection during electrostatic discharge event. The thyristor is connected between voltage reference nodes having a common potential, such as ground nodes, that are isolated from one another during normal operating conditions. During an ESD event on one of the voltage reference nodes, the low voltage thyrister triggers, at a voltage of less than ten volts, to help discharge the ESD current through the otherwise isolated ground node.

Claims (108)

1. An integrated data processing device comprising:

a first circuit coupled to a first voltage reference node;

a second circuit coupled to a second voltage reference node;

an electrostatic discharge protection device operable to provide a current path between the first voltage reference node and the second voltage reference node during an electrostatic event, the electrostatic discharge protection device comprising

a first conductivity type junction formed between a first region of a first conductivity type and a second region of a second conductivity type;

a second conductivity type junction formed between the second region and a third region of the first conductivity type;

a third conductivity type junction formed between the third region and a fourth region of the second conductivity type, the fourth region coupled to the second voltage reference node; and

an anode node coupled to the first voltage reference node and connected to one or more regions of the electrostatic discharge protection device including the first region, wherein all regions of the discharge protection device connected to the anode node are of a common conductivity type; and

a low voltage trigger control portion coupled to the second region and the third region to provide a electrostatic discharge protection device triggering current at a voltage of less than 10 volts.

2. An apparatus comprising:

a first circuit coupled to a first voltage reference node;

a second circuit coupled to a second voltage reference node;

an electrostatic discharge protection device operable to provide a current path and a capacitance of less than 120 Femtofarads between the first voltage reference node and the second voltage reference node during an electrostatic event, the electrostatic discharge protection device comprising

a thyristor coupled between the first voltage reference node and the second voltage reference node to provide the current path.

3. The apparatus of claim 2 wherein the first circuit is an analog circuit and the second circuit is a digital circuit.

4. The apparatus of claim 2 wherein the first circuit is a radio frequency analog circuit.

5. The apparatus of claim 4 wherein the second circuit is a digital circuit.

6. The apparatus of claim 4 wherein the second circuit is an analog circuit.

7. A method comprising:

providing a voltage reference to a first circuit of an integrated circuit device using a first voltage reference node during normal operation;

providing the voltage reference to a second circuit of the integrated circuit device using a second voltage reference node during normal operation, the second voltage reference node and the first voltage reference node being different nodes;

detecting a voltage difference between the first voltage reference node and the second voltage reference node of less than approximately 10 volts to determine when an electrostatic discharge event is occurring; and

providing a conductive path through a thyristor having a capacitance of less than 120 Femtofarads from anode to cathode when the voltage difference is detected.

8. The method of claim 7 , wherein the voltage difference is less than 10 volts.

9. An apparatus comprising:

a thyristor comprising

a plurality conductivity type junctions comprising

a first conductivity type junction formed between a first region of a first conductivity type and a second region of a second conductivity type;

a second conductivity type junction formed between the second region and a third region of the first conductivity type;

a third conductivity type junction formed between the third region and a fourth region of the second conductivity type;

a voltage trigger control coupled to the second region and the third region to provide a thyristor triggering current at a voltage of less than 10 volts;

an anode connected to the plurality of conductivity type junctions only at the first region;

a cathode coupled to the fourth region;

a first voltage reference node coupled to a first circuit and the anode; and

a second voltage reference node coupled to a second circuit and the cathode, wherein the thyristor is operable to provide a current path between the first voltage reference node and the second voltage reference node during an electrostatic event.

10. The apparatus of claim 9 wherein the second region is a well region of the second conductivity type.

11. The apparatus of claim 10 wherein the third region is a well region of the first conductivity type.

12. The apparatus of claim 11 , wherein the cathode is connected to the plurality of conductivity type junctions only at the fourth region.

13. The apparatus of claim 9 , wherein the cathode is connected to the plurality of conductivity type junctions only at the fourth region.

14. The apparatus of claim 9 , wherein the first voltage reference node and the second reference node are to provide a common voltage reference.

15. The apparatus of claim 9 , wherein the voltage trigger control is a zener diode.

16. The apparatus of claim 9 , wherein the voltage trigger control is a field effect transistor.

17. The apparatus of claim 9 , wherein the first voltage reference node and the second voltage reference node are ground nodes.

18. The device of claim 17 , wherein the electrostatic discharge protection device further comprises:

a cathode node coupled to the second voltage reference node and connected to one or more regions of the electrostatic discharge protection device including the fourth region, wherein all regions of the electrostatic discharge protection device connected to the anode node are of a common conductivity type.

19. The apparatus of claim 1 wherein the first circuit is an analog circuit and the second circuit is a digital circuit.

20. The apparatus of claim 1 the second circuit is a digital circuit.

21. The apparatus of claim 1 wherein the first circuit is a radio frequency analog circuit.

22. The apparatus of claim 21 wherein the second circuit is an analog circuit.

23. The apparatus of claim 1 , wherein the low voltage trigger control portion is a zener diode.

24. The apparatus of claim 1 , wherein the low voltage trigger control portion is a field effect transistor.

25. An integrated data processing device comprising:

a first circuit coupled to a first voltage reference node;

a second circuit coupled to a second voltage reference node;

an electrostatic discharge protection device operable to provide a current path and a capacitance of less than 120 Femtofarads between the first voltage reference node and the second voltage reference node during an electrostatic event, the electrostatic discharge protection device comprising

a first conductivity type junction formed between a first region of a first conductivity type and a second region of a second conductivity type;

a second conductivity type junction formed between the second region and a third region of the first conductivity type;

a third conductivity type junction formed between the third region and a fourth region of the second conductivity type, the fourth region coupled to the second voltage reference node; and

an anode node coupled to the first voltage reference node and connected to one or more regions of the electrostatic discharge protection device including the first region, wherein all regions of the discharge protection device connected to the anode node are of a common conductivity type.

26. The apparatus of claim 25 wherein the first circuit is an analog circuit and the second circuit is a digital circuit.

27. The apparatus of claim 25 wherein the second circuit is a digital circuit.

28. The apparatus of claim 26 wherein the first circuit is a radio frequency analog circuit.

29. The apparatus of claim 25 wherein the second circuit is an analog circuit.

30. An apparatus comprising:

a first circuit coupled to a first voltage reference node;

a second circuit coupled to a second voltage reference node;

an electrostatic discharge protection device operable to provide a current path between the first voltage reference node and the second voltage reference node during an electrostatic event, the electrostatic discharge protection device comprising

a thyristor coupled between the first voltage reference node and the second voltage reference node to provide the current path, the thyristor comprising a voltage trigger control portion coupled to provide a thyristor triggering current at a voltage of less than 10 volts.

31. The apparatus of claim 30 wherein the first circuit is an analog circuit and the second circuit is a digital circuit.

32. The apparatus of claim 30 wherein the second circuit is a digital circuit.

33. The apparatus of claim 30 wherein the first circuit is a radio frequency analog circuit.

34. The apparatus of claim 33 wherein the second circuit is an analog circuit.

35. The apparatus of claim 30 , wherein the voltage trigger control portion is a zener diode.

36. The apparatus of claim 30 , wherein the voltage trigger control portion is a field effect transistor.

37. The apparatus of claim 7 wherein the first circuit is an analog circuit and the second circuit is a digital circuit.

38. The apparatus of claim 7 wherein the second circuit is a digital circuit.

39. The apparatus of claim 7 wherein the first circuit is a radio frequency analog circuit.

40. The apparatus of claim 39 wherein the second circuit is an analog circuit.

41. The apparatus of claim 9 wherein the first circuit is an analog circuit and the second circuit is a digital circuit.

42. The apparatus of claim 9 wherein the second circuit is a digital circuit.

43. The apparatus of claim 9 wherein the first circuit is a radio frequency analog circuit.

44. The apparatus of claim 43 wherein the second circuit is an analog circuit.

45. The apparatus of claim 9 , wherein the voltage trigger control is a zener diode.

46. The apparatus of claim 9 , wherein the voltage trigger control is a field effect transistor.

47. An apparatus comprising:

a thyristor operable to provide a current path from a first region to a fourth region having

a capacitance of less than 120 Femtofarads comprising

a plurality conductivity type junctions comprising

a first conductivity type junction formed between the first region of a first conductivity type and a second region of a second conductivity type;

a second conductivity type junction formed between the second region and a third region of the first conductivity type;

a third conductivity type junction formed between the third region and the fourth region of the second conductivity type;

an anode connected to the plurality of conductivity type junctions only at the first region;

a cathode coupled to the fourth region;

a first voltage reference node coupled to a first circuit and the anode; and

a second voltage reference node coupled to a second circuit and the cathode, wherein the thyristor is operable to provide a current path between the first voltage reference node and the second voltage reference node during an electrostatic event.

48. The apparatus of claim 47 wherein the second region is a well region of the second conductivity type.

49. The apparatus of claim 48 wherein the third region is a well region of the first conductivity type.

50. The apparatus of claim 49 , wherein the cathode is connected to the plurality of conductivity type junctions only at the fourth region.

51. The apparatus of claim 47 , wherein the cathode is connected to the plurality of conductivity type junctions only at the fourth region.

52. The apparatus of claim 47 , wherein the first voltage reference node and the second reference node are to provide a common voltage reference.

53. The apparatus of claim 47 further comprising:

a voltage trigger control coupled to the second region and the third region to provide a thyristor triggering current.

54. The apparatus of claim 53 , wherein the voltage trigger control is a zener diode.

55. The apparatus of claim 53 , wherein the voltage trigger control is a field effect transistor.

56. The apparatus of claim 47 wherein the first circuit is an analog circuit and the second circuit is a digital circuit.

57. The apparatus of claim 47 wherein the second circuit is a digital circuit.

58. The apparatus of claim 47 wherein the first circuit is a radio frequency analog circuit.

59. The apparatus of claim 58 wherein the second circuit is an analog circuit.

Assignments (22)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
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To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
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To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded May 13, 2010
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To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Feb 2, 2007
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 14, 2002
From: IDA, RICHARD T.; XU, HONGZHONG
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