IP Library › Granted Patent US 6,794,889
Granted Patent Utility
US 6,794,889 · Confirmation No. 2231

UNIFIED APPARATUS AND METHOD TO ASSURE PROBE CARD-TO-WAFER PARALLELISM IN SEMICONDUCTOR AUTOMATIC WAFER TEST, PROBE CARD MEASUREMENT SYSTEMS, AND PROBE CARD MANUFACTURING

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Quick Facts
Patent No.
US 6,794,889
App. No.
10/133,165
Filed
2002-04-26
Granted
2004-09-21
Pub. No.
US20030201764A1
Art Unit
2829
PTA
-146 days