Patent Assignment
Reel/Frame 019990/0760
Assignment of Assignor's Interest
Recorded: 2007-10-18
Received: 2007-10-18
Pages: 11
Assignor
AGILENT TECHNOLOGIES, INC.
Executed: 2007-04-05
Assignee
VERIGY (SINGAPORE) PTE. LTD.
NO 1 YISHUN AVE 7, SGX, 768923, SINGAPORE
Covered Properties
(57)
Low Ac Resistance Foil Winding for Magnetic Coils on Gapped Cores
Application:
11/547,831 →
Method for Optimizing Test Order, and Machine-Readable Media Storing Sequences of Instructions to Perform Same
Application:
11/036,574 →
Signal Isolating Blindmate Connector
Application:
10/903,271 →
Parallel Calibration System for a Test Device
Application:
10/886,848 →
Sigma-Delta Modulator with Pwm Output
Application:
10/854,666 →
Methods and Apparatus for Identifying Test Number Collisions
Application:
10/839,834 →
Apparatus, System and/or Method for Converting a Serial Test to a Parallel Test
Application:
10/827,888 →
Report Format Editor for Circuit Test
Application:
10/817,305 →
Verification of Integrated Circuit Tests Using Test Simulation and Integrated Circuit Simulation with Simulated Failure
Application:
10/815,521 →
Source Synchronous Timing Extraction, Cyclization and Sampling
Application:
10/790,960 →
Dynamic Waveform Resource Management
Application:
10/782,984 →
Polynomial Fit for Jitter Separation
Application:
10/774,265 →
Circuit and Method for Determining Integrated Circuit Propagation Delay
Application:
10/695,317 →
Methods and Apparatus for Optimizing Lists of Waveforms
Application:
10/685,885 →
Methods and Apparatus for Optimizing the Masking of Waveforms to Reduce the Number of Waveforms in a List of Waveforms
Application:
10/686,376 →
Memory Tester Uses Arbitrary Dynamic Mappings to Serialize Vectors into Transmitted Sub-Vectors and De-Serialize Received Sub-Vectors into Vectors
Application:
10/683,796 →
Digital Measurements of Spread Spectrum Clocking
Application:
10/671,414 →
Systems and Methods for Testing Performance of an Electronic Device
Application:
10/461,252 →
Apparatus for Calibrating High Frequency Signal Measurement Equipment
Application:
10/455,659 →
Cooling a Microchip on a Circuit Board
Application:
10/448,950 →
Electrical System Like a Testing System for Testing the Channels of a Communication System
Application:
10/305,233 →
Electrical System Like a Testing System for Testing the Channels of a Communication System
Application:
10/305,286 →
Track and Hold Circuit
Application:
10/280,662 →
Measuring and/or Calibrating a Test Head
Application:
10/273,949 →
Signal Preconditioning for Analog-to-Digital Conversion with Timestamps
Application:
10/269,706 →
Empirical Data Based Test Optimization Method
Application:
10/255,480 →
Semiconductor Integrated Circuit Device and a Method of Manufacturing the Same
Application:
10/251,850 →
System and Method for Heterogeneous Multi-Site Testing
Application:
10/252,863 →
Droop Compensation Filter Having High Pass Characteristic
Application:
10/237,397 →
Simultaneous Display of Data Gathered Using Multiple Data Gathering Mechanisms
Application:
10/206,319 →
Recapture of a Portion of a Displayed Waveform Without Loss of Existing Data in the Waveform Display
Application:
10/206,441 →
Plug-Type Connector for Simultaneously Connecting Several Coaxial Cables
Application:
10/198,253 →
High Output Amplifier for Stable Operation
Application:
10/175,369 →
Device Power Supply and Ic Test Apparatus
Application:
10/154,503 →
Cooler for Electrical and/ or Electronic Components, Linked to Present Cooling Needs
Application:
10/154,319 →
Unified Apparatus and Method to Assure Probe Card-to-Wafer Parallelism in Semiconductor Automatic Wafer Test, Probe Card Measurement Systems, and Probe Card Manufacturing
Application:
10/133,165 →
Device, Method, and System for Detecting the Presence of Liquid in Proximity to Electronic Components
Application:
10/134,222 →
Apparatus for Testing Integrated Circuits Having an Integrated Unit for Testing Digital and Analog Signals
Application:
10/054,139 →
High-Sensitivity Differential Data Latch System
Application:
10/051,836 →
N-Squared Algorithm for Optimizing Correlated Events
Application:
10/047,344 →
Virtualized Generic Equipment Model Data and Control Router for Factory Automation
Application:
10/014,772 →
Automatic Test Equipment for Testing a Device Under Test
Application:
09/999,315 →
Filter for Injecting Data Dependent Jitter and Level Noise
Application:
09/975,431 →
Circuit for Providing a Logical Output Signal in Accordance with Crossing Points of Differential Signals
Application:
09/957,922 →
Bandwidth Matching for Scan Architectures in an Integrated Circuit
Application:
09/946,857 →
Timing Calibration and Timing Calibration Verification of Electronic Circuit Testers
Application:
09/923,548 →
Methods and Apparatus for Minimizing Current Surges During Integrated Circuit Testing
Application:
09/908,948 →
Method and Apparatus for Analog to Digital Conversion Using Time-Varying Reference Signal
Application:
09/905,747 →
Algorithmically Programmable Memory Tester with Test Sites Operating in a Slave Mode
Application:
09/896,474 →
Analog to Digital Signal Conversion Method and Apparatus
Application:
09/875,848 →
Method and Apparatus for Testing Digital Devices Using Transition Timestamps
Application:
09/875,567 →
Integrated Circuit Tester with Multi-Port Testing Functionality
Application:
09/870,955 →
Algorithmically Programmable Memory Tester with History Fifo's That Aid in Error Analysis and Recovery
Application:
09/842,433 →
Algorithmically Programmable Memory Tester with Breakpoint Trigger, Error Jamming and 'Scope Mode That Memorizes Target Sequences
Application:
09/838,766 →
Digital Signal Transition Splitting Method and Apparatus
Application:
09/832,726 →
Test Vector Compression Method
Application:
09/802,440 →
Compressible conductive interface
Application:
09/776,337 →