IP Library Granted Patent US 6,917,029
Granted Patent B2
US 6,917,029 · App. 10/187,479 · Granted Jul 12, 2005

Four-component pixel structure leading to improved image quality

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Quick Facts
Patent No.
US 6,917,029
App. No.
10/187,479
Granted
Jul 12, 2005
Kind
B2
Abstract

Pixel structures and a read-out method of pixels are disclosed. The pixel structures and the read-out method improve the image quality of imaging devices or imaging sensors based on such pixels. A pixel comprises in a parallel circuit configuration a radiation sensitive element and an adjustable current source, said current source being adapted for delivering a high current. A 4-transistor pixel structure is also disclosed. A method of obtaining a calibrated read-out signal of a pixel having at least a photosensitive element and a current source comprise a number of steps. A photocurrent generated on the pixel added to a current generated by a current source in parallel with the photosensitive element is read to obtain a first signal. The pixel is also read with the current source off to obtain a second signal. The first signal is subtracted from the second signal, and the resulting signal is amplified to obtain the read-out signal.

Claims (7)

1. A pixel for imaging applications fabricated in a MOS technology, said pixel comprising:

a photosensitive element and a first transistor having a gate and a first and second electrode, the first electrode of the first transistor and said photosensitive element being directly connected to a same node;

a second transistor having a gate, said second transistor being coupled to said node, thereby forming a connection, and said second transistor being part of an amplifying circuit; and

a third transistor having a gate and having two electrodes, said third transistor being connected in said connection between said node and said second transistor, the gate of the first transistor and the gate of the third transistor being electrically coupled together to a same DC voltage;

wherein one of said electrodes of said third transistor is connected to said gate of said second transistor and the other of said electrodes is connected to said node.

2. The pixel as recited in claim 1 , wherein said gate of said first transistor is at a first voltage and said first electrode of said first transistor is at a second voltage, said second electrode of said first transistor being connected to said photosensitive element.

3. The pixel as recited in claim 1 , further comprising an adjustable current source in a parallel configuration to the photosensitive element, the current source being adapted for delivering a high current.

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2012
From: ON SEMICONDUCTOR IMAGE SENSOR BVBA
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 028598/0477 →
CHANGE OF NAME Recorded May 20, 2011
From: CYPRESS SEMICONDUCTOR CORPORATION (BELGIUM) BVBA
To: ON SEMICONDUCTOR IMAGE SENSOR
Reel/Frame 026319/0730 →
PURCHASE AGREEMENT Recorded Oct 17, 2005
From: FILLFACTORY N.V.
To: CYPRESS SEMICONDUCTOR CORPORATION (BELGIUM) BVBA
Reel/Frame 017083/0803 →