Granted Patent
Utility
US 6,686,224
· Confirmation No. 5430
CHIP MANUFACTURING METHOD FOR CUTTING TEST PADS FROM INTEGRATED CIRCUITS BY SECTIONING CIRCUIT CHIPS FROM CIRCUIT SUBSTRATE
Inventor:
Kunihiko Higashi
|
⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-12-15 | IFEE |
Issue Fee Payment (PTO-85B) | 2 | View | |
| 2002-07-30 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-07-30 | SPEC |
Specification | 17 | View | |
| 2002-07-30 | CLM |
Claims | 10 | View | |
| 2002-07-30 | ABST |
Abstract | 1 | View | |
| 2002-07-30 | DRW |
Drawings-only black and white line drawings | 6 | View | |
| 2002-07-30 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Kunihiko Higashi
Kanagawa, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/113
H10P74/273
G01R31/2886
Prosecution
- Examiner
- BLUM, DAVID S
- Art Unit
- 2813
- Customer No.
- 26304
- Docket No.
- NECW 19.851
- Confirmation No.
- 5430
Foreign Priority
2001-277877
·
2001-09-13
·
JAPAN
Publication
- Pub. No.
- US20030049871A1
- Pub. Date
- 2003-03-13
Patent Term Adjustment
0days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-13
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Quick Facts
- Patent No.
- US 6,686,224
- App. No.
- 10/208,496
- Filed
- 2002-07-30
- Granted
- 2004-02-03
- Pub. No.
- US20030049871A1
- Examiner
- BLUM, DAVID S
- Art Unit
- 2813
- PTA
- 0 days
External Links