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App. No. 10/245,626 · Confirmation No. 7432

METHOD FOR TESTING INTEGRATED SEMICONDUCTOR MEMORY DEVICES

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Quick Facts
App. No.
10/245,626
Filed
2002-09-17
Granted
2004-06-15
Pub. No.
US20030053353A1
Examiner
HOANG, HUAN
Art Unit
2818
PTA
-5 days