Granted Patent B2

US 7,028,237 · App. 10/385,527 · Granted Apr 11, 2006

Abstract

Claims (33)

1. An internal bus testing device for a semiconductor integrated circuit in which an internal bus control circuit and a plurality of modules are linked by a plurality of internal buses, comprising:

an area selector provided to cause the internal bus control circuit to select an address area corresponding to one of the plurality of internal buses;

an area address setting unit setting the internal bus control circuit in an internal bus test mode in response to an internal bus test start signal, the area address setting unit storing a state setting signal and a predetermined address value indicating the address area; and

a control unit supplying, at a start of an internal bus test, the address value from the area address setting unit to the area selector by transmitting the state setting signal from the area address setting unit to the area selector,

wherein the internal bus testing device is provided to access one of the plurality of modules linked to one of the plurality of internal buses, with respect to all address areas assigned to the semiconductor integrated circuit when an arbitrary address area corresponding to one of the plurality of internal buses is selected from among the assigned address areas.

2. The internal bus testing device of claim 1 further comprising a test start unit generating the internal bus test start signal in accordance with a state of an external terminal, the test start unit outputting the internal bus start signal to the area address setting unit.

3. The internal bus testing device of claim 1 further comprising a register provided to temporarily store data which is supplied to said one of the plurality of internal buses linked to the accessed one of the plurality of modules, the register outputting the stored data which is used to generate a verification result of the internal bus testing.

4. The internal bus testing device of claim 1 wherein the control unit comprises a bus selector connected to the area selector, and a state machine connected to the area address setting unit.

5. An internal bus testing device for a semiconductor integrated circuit in which an internal bus control circuit and a plurality of modules are linked by a plurality of internal buses, comprising:

a plurality of area selectors each provided to cause the internal bus control circuit to select an address area corresponding to a particular one of the plurality of internal buses;

an area address setting unit setting the internal bus control circuit in an internal bus test mode in response to an internal bus test start signal, the area address setting unit storing a state setting signal and a predetermined address value indicating an address area for a particular one of the plurality of area selectors; and

a control unit supplying, at a start of an internal bus test, the address value from the area address setting unit to the particular one of the plurality of area selectors by transmitting the state setting signal from the area address setting unit to the particular area selector,

wherein the internal bus testing device is provided to access one of the plurality of modules linked to one of the plurality of internal buses, with respect to all address areas assigned to the semiconductor integrated circuit when an arbitrary address area corresponding to one of the plurality of internal buses is selected from among the assigned address areas.

6. The internal bus testing device of claim 5 further comprising a register provided on each of the plurality of internal buses to temporarily store data which is supplied to one of the plurality of internal buses linked to the accessed one of the plurality of modules, the register outputting the stored data which is used to generate a verification result of the internal bus testing.

7. An internal bus testing method for a semiconductor integrated circuit in which an internal bus control circuit and a plurality of modules are linked by a plurality of internal buses, the internal bus testing method comprising the steps of:

providing an area selector which causes the internal bus control circuit to select an address area corresponding to one of the plurality of internal buses;

providing an area address setting unit which sets the internal bus control circuit in an internal bus test mode in response to an internal bus test start signal, the area address setting unit storing a state setting signal and a predetermined address value indicating the address area;

receiving the internal bus test start signal which is set in ON state and sent to the area address setting unit; and

supplying, at a start of an internal bus test, the address value from the area address setting unit to the area selector by transmitting the state setting signal from the area address setting unit to the area selector,

wherein one of the plurality of modules linked to one of the plurality of internal buses is accessed with respect to all address areas assigned to the semiconductor integrated circuit when an arbitrary address area corresponding to one of the plurality of internal buses is selected from among the assigned address areas.

8. The internal bus testing method of claim 7 further comprising the step of outputting the internal bus test start signal to the area address setting unit in accordance with a state of an external terminal.

9. The internal bus testing method of claim 7 further comprising the steps of:

providing a register which temporarily stores data supplied to said one of the plurality of internal buses linked to the accessed one of the plurality of modules; and

outputting the stored data of the register which is used to generate a verification result of the internal bus testing.

10. An internal bus testing method for a semiconductor integrated circuit in which an internal bus control circuit and a plurality of modules are linked by a plurality of internal buses, the internal bus testing method comprising the steps of:

providing a plurality of area selectors each of which causes the internal bus control circuit to select an address area corresponding to a particular one of the plurality of internal buses;

providing an area address setting unit which sets the internal bus control circuit in an internal bus test mode in response to an internal bus test start signal, the area address setting unit storing a state setting signal and a predetermined address value indicating an address area for a particular one of the plurality of area selectors;

supplying, at a start of an internal bus test, the address value from the area address setting unit to the particular one of the plurality of area selectors by transmitting the state setting signal from the area address setting unit to the particular area selector,

wherein the internal bus testing device is provided to access one of the plurality of modules linked to one of the plurality of internal buses, with respect to all address areas assigned to the semiconductor integrated circuit when an arbitrary address area corresponding to one of the plurality of internal buses is selected from among the assigned address areas.

11. The internal bus testing method of claim 10 further comprising the step of outputting the internal bus test start signal to the area address setting unit in accordance with a state of an external terminal.

12. The internal bus testing method of claim 10 further comprising the steps of:

providing a register which temporarily stores data supplied to said one of the plurality of internal buses linked to the accessed one of the plurality of modules; and

outputting the stored data of the register which is used to generate a verification result of the internal bus testing.

Assignments (9)