Measuring propagation delays of programmable logic devices
View Patent ↗Methods are described herein, for improving the accuracy of propagation delay measurements of programmable electronic devices in a production environment. In one method, a built-in self-test is implemented by configuring an oscillator and a counter connected to each other within the PLD. The oscillator is enabled to oscillate for a pre-determined length of time and to cause the counter to count up at the end of each cycle of oscillation. The counter reading is correlated to an accurate propagation delay measurement by using a previously generated counter-delay correlation curve. In other methods, the counter is built outside of the logic of the PLD. Methods are described for adapting typical output macro cells to provide combinatorial feedback for configuring oscillators within PLDs without such capabilities.
1. A system for measuring the propagation delay of a programmable logic device, comprising:
a ring oscillator configured within the device when the device is in a test mode; and
a counter coupled to the oscillator, wherein, during a test period, the oscillator is enabled to oscillate and the counter is programmed to count the oscillator's cycles in the test period,
wherein the oscillator is configured using a combinatorial feedback that is implemented in one or more of the following configurations:
a connection bypassing a clocked register within one or more output cells of the device; and
a connection through an unclocked register within one or more of the output cells of the device.
2. The system of claim 1 , wherein the unclocked register is implemented by holding both clock and clock bar signal related to the clocked register simultaneously HIGH.
3. The system of claim 1 , wherein each of the cycles correlates to a propagation delay measurement of the device.
4. The system of claim 1 , wherein the oscillator has multiple propagation paths and one or more of the multiple propagation paths through the oscillator correlates to one direct propagation path through the device.
5. The system of claim 1 further comprising, a controller adapted for one or more of the following:
controlling the programmable device during the test period;
resetting the counter at the beginning of the test period; and
serially shifting a final counter value related to the counter as output of the device.
6. The system of claim 1 further comprising, a register for serial shifting a counter value out of the counter at end of the test period.
7. The system of claim 1 further comprising, automatic test equipment connected to the device and the counter and capable of correlating a counter value related to the counter at end of the test period to a propagation delay measurement of the device.
8. A programmable logic device configured to measure the device's propagation delay, comprising:
a ring oscillator configured in macrocells of the device while the device is in a test mode; and
a counter associated with the ring oscillator and adapted for counting the oscillator's cycles.
9. The programmable logic device of claim 8 , wherein the ring oscillator comprises multiple macrocells coupled in series by multiple propagation paths.
10. A method for measuring propagation delay of a programmable logic device, comprising:
activating a test mode of operation for the device;
transmitting an oscillating signal through the device; and
counting cycles of oscillation related to the signal,
wherein the oscillating signal is transmitted by adapting one or more output cells of the device being measured to provide a combinatorial feedback that is configured using one or more of the following methods:
bypassing a clocked register within the output cell of the device; and
converting the clocked register to a unclocked register.
11. The method of claim 10 further comprising, correlating the cycle count to a correlation curve to obtain the propagation delay.
12. The method of claim 10 further comprising,
serially shifting the cycle count value to test equipment for translating the cycle count value to obtain the propagation delay measurement of the device.
13. The method of claim 10 , wherein the clocked register is converted to an unclocked register by one or more of the following methods:
processing a clock signal controlling the clocked register to generate a clock bar signal that is simultaneously HIGH with the clock signal during the test mode; and
configuring a clock signal generator to generate the clock signal and clock bar signal that are simultaneously at HIGH during the test mode.
14. A method of measuring propagation delay of a programmable logic device (PLD), comprising:
configuring an oscillator in the macrocells of a PLD, at least part of the propagation path of the oscillator passing through registers within the macrocells;
forcing the registers to pass an oscillator signal in the propagation path without the register being clocked;
configuring a counter coupled to the oscillator, the counter operable to count the oscillations of the oscillator;
enabling the oscillator to oscillate for a given time period;
reading from the counter a count of the number of oscillations during the given time period; and
comparing the count with reference data to determine the propagation delay of the PLD.
15. The method of claim 14 , wherein the oscillator is a ring oscillator.
16. The method of claim 14 , wherein the counter is configured in control logic of the PLD.
17. A programmable logic device comprising:
a programmable logic array;
a macrocell coupled to the array, the macrocell having a register operable to pass a data signal in response to a clock signal; and
a clock circuit operable to force the macrocell register to pass the data signal without the register being clocked.
18. The programmable logic device of claim 17 , wherein the register is responsive to a clock signal comprised of clock and clock bar signals, and the clock circuit is operable to hold both signals in an enabling state, thereby forcing the register to pass the data signal without the register being clocked.