Connection of integrated circuits
View Patent ↗A method for connecting a first integrated circuit having an elevated contact area lying on an elastic elevation on a main area thereof and a second integrated circuit having a corresponding non-elevated contact area on a main area thereof includes applying a liquid adhesive between the first and second main areas; aligning the first and second main areas so that the elevated contact area is opposite the corresponding non-elevated contact area; and curing the adhesive, thereby firmly connecting the first and second integrated circuits.
1. A method for connecting a first integrated circuit and a second integrated circuit, the method comprising:
providing a plurality of first integrated circuits, each of which includes a first wiring device on a first main surface, and a corresponding plurality of second integrated circuits, each of which includes a second wiring device on a second main surface, the plurality of first integrated circuits and the plurality of second integrated circuits being in the form of chip pairs; wherein one of the first and second wiring devices comprises a plurality of elevated contact areas lying on respective elastic elevations and wherein the other of the first and second wiring devices comprises a plurality of non-elevated contact areas that can be aligned to the elevated contact areas;
mounting the first integrated circuits onto a substrate;
dispensing a liquid adhesive on at least one of the first and second main surfaces;
aligning the first and second main areas so that the elevated contact area and the corresponding non-elevated contact area are brought into electrical contact;
pressing said first and second main areas by simultaneously applying pressure onto the plurality of second integrated circuits using a pressure plate, such that the elevated contact areas are deformed; and
curing the adhesive, thereby firmly connecting the first and second integrated circuits, wherein curing the adhesive includes at least partially curing the adhesive while the elevated contact area is deformed such that the elevated contact area remains deformed subsequent to connecting the first and second integrated circuits.
2. The method of claim 1 , further comprising providing a bonding wire in electrical communication with a contact area on the substrate and a contact area on the first circuit device.
3. The method of claim 1 , further comprising selecting at least one of the first and second integrated circuits to be in wafer form.
4. The method of claim 1 , further comprising selecting at least one of the first and second integrated circuits to be in chip form.
5. The method of claim 1 , further comprising selecting at least one of the first and second integrated circuits to be in the form of a hybrid of a wafer and a chip.
6. The method of claim 1 , further comprising connecting the elevated contact area and the non-elevated contact area with solder.
7. The method of claim 1 , further comprising connecting the elevated contact area and the non-elevated contact area with an electrically conducting adhesive.
8. The method of claim 1 , further comprising, prior to aligning, connecting contact areas on the substrate to contact areas on an edge region of the first main surface by bonding wires such that the bonding wires are embedded in a respective space between said first and second integrated circuits in the adhesive.
9. The method of claim 1 , wherein the elevated contact areas are connected to the non-elevated contact areas by at least one of solder and an electrically conductive adhesive.