IP Library Granted Patent US 7,075,363
Granted Patent B1
US 7,075,363 · App. 10/615,093 · Granted Jul 11, 2006

Tuned continuous time delay FIR equalizer

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Quick Facts
Patent No.
US 7,075,363
App. No.
10/615,093
Granted
Jul 11, 2006
Kind
B1
Abstract

An analog finite impulse response (“FIR”) filter generates a continuous time output using a chain of tunable delay elements. The tunable delay elements generate a time delay in an input signal. A calibration circuit, consisting of a control loop, tunes the delay elements to provide precision in the time delay response of the delay elements. The control loop generates a delay adjustment, based on the period of reference signals, and the phase adjustment is used to tune the parameters of the delay elements. The tunable delay elements may comprise any combination of transmission lines, lumped elements and semi-lumped elements.

Claims (41)

1. A circuit comprising:

at least one delay element for receiving an input signal and for generating a time delay in said signal to produce a time-delayed signal;

calibration circuit, coupled to said delay element, for calibrating said delay element so as to match said time delay to a predetermined time period, said calibration circuit comprising a control loop for receiving an output signal from said delay element and a reference signal and for generating a phase adjustment based on a phase difference between said output and reference signals; and

multiplier-summing circuit, coupled to said delay element, for multiplying at least one signal output from said delay element to produce at least one multiplied signal and for summing at least one multiplied signal to generate an equalized signal.

2. The circuit as set forth in claim 1 , wherein:

said delay element comprises selectable parameters for receiving a phase adjustment from said control loop and for setting said selectable parameters based on said phase adjustment.

3. The circuit as set forth in claim 2 , wherein said control loop comprises:

phase detector for measuring a said phase difference between said reference and output; and

loop filter, coupled to receive a signal output from said phase detector, for generating said phase adjustment.

4. The circuit as set forth in claim 1 , wherein said delay element comprises a transmission line.

5. The circuit as set forth in claim 4 , wherein said delay element further comprises a means for adjusting capacitance for said transmission line, so as to calibrate said delay element.

6. The circuit as set forth in claim 1 , wherein said delay element comprises lumped circuit elements.

7. The circuit as set forth in claim 6 , wherein said delay element further comprises a means for selecting combinations of said lumped parameters to calibrate said delay element.

8. The circuit as set forth in claim 1 , wherein said delay element comprises a plurality of stub transmission lines.

9. The circuit as set forth in claim 8 , wherein said delay element further comprises a means for selecting a length of said stub transmission lines to calibrate said delay element.

10. The circuit as set forth in claim 1 , wherein:

said reference signal comprises said input signal; and

said output signal comprises said time-delayed signal.

11. A method for filtering a signal, said method comprising the steps of:

receiving an input signal in at least one delay element;

generating a time delay in said signal to produce a time-delayed signal;

calibrating said delay element so as to match said time delay to a predetermined time period, wherein said calibrating comprises:

receiving an output signal from said delay element and a reference signal; and

generating a phase adjustment based on a phase difference between said output and reference signals;

multiplying at least one signal output from said delay element to produce at least one multiplied signal; and

summing at least one multiplied signal to generate an equalized signal.

12. The method as set forth in claim 11 , wherein:

the step of receiving an input signal in at least one delay element comprises the steps of receiving an input signal in a delay element that comprises selectable parameters, receiving a phase adjustment, and setting said selectable parameters based on said phase adjustment.

13. The method as set forth in claim 12 , wherein the step of generating a phase adjustment comprises the steps of:

measuring said phase difference between said reference and output signals; and

generating said phase adjustment.

14. The method as set forth in claim 11 , wherein said delay element comprises a transmission line.

15. The method as set forth in claim 14 , further comprising the steps of adjusting capacitance for said transmission line, so as to calibrate said delay element.

16. The method as set forth in claim 11 , wherein said delay element comprises lumped circuit elements.

17. The method as set forth in claim 16 , further comprising the step of selecting combinations of said lumped parameters to calibrate said delay element.

18. The method as set forth in claim 11 , wherein said delay element comprises a plurality of stub transmission lines.

19. The method as set forth in claim 18 , further comprising the step of selecting a length of said stub transmission lines to calibrate said delay element.

20. A circuit comprising:

at least one delay element for receiving a signal and for generating a time delay in said signal, said delay element comprising a transmission line and a means for adjusting capacitance for said transmission line for calibrating said delay element;

calibration circuit, coupled to said delay element, for calibrating said delay element so as to match said time delay to a predetermined time period; wherein said calibration circuit generating a phase adjustment signal based on a phase difference between said output of said delay element and said signal and

multiplier-summing circuit, coupled to said delay element, for multiplying at least one signal output from said delay element and for summing at least one multiplied signal to generate an equalized signal.

Assignments (12)
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 047196 FRAME: 0097. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 6, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048555/0510 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047196/0097 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: BROADCOM CORPORATION
Reel/Frame 041712/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2017
From: BROADCOM CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041706/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: BROADCOM CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037806/0001 →
CHANGE OF NAME Recorded Apr 16, 2015
From: NETLOGIC MICROSYSTEMS, INC.
To: NETLOGIC I LLC
Reel/Frame 035443/0824 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2015
From: NETLOGIC I LLC
To: BROADCOM CORPORATION
Reel/Frame 035443/0763 →
RELEASE OF SECURITY INTEREST Recorded Aug 30, 2011
From: SILICON VALLEY BANK
To: NETLOGIC MICROSYSTEMS, INC.; NETLOGIC MICROSYSTEMS INTERNATIONAL LIMITED; NETLOGIC MICROSYSTEMS CAYMANS LIMITED
Reel/Frame 026830/0141 →
SECURITY AGREEMENT Recorded Jul 17, 2009
From: NETLOGIC MICROSYSTEMS, INC.; NETLOGIC MICROSYSTEMS INTERNATIONAL LIMITED; NETLOGIC MICROSYSTEMS CAYMANS LIMITED
To: SILICON VALLEY BANK
Reel/Frame 022973/0710 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2007
From: AELUROS, INC.
To: NETLOGIC MICROSYSTEMS, INC.
Reel/Frame 020403/0192 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2007
From: AELUROS, INC.
To: NETLOGIC MICROSYSTEMS, INC.
Reel/Frame 020174/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 31, 2003
From: THON, LARS E.
To: AELUROS, INC.
Reel/Frame 014643/0978 →