Memory cell signal window testing apparatus
View Patent ↗A memory cell signal window testing apparatus 101 and method for testing the signal window of a memory are disclosed. First data is written to a memory cell during a write cycle. A low cell signal is read from the memory cell during a first read cycle. A comparison is made between the low signal and a low reference signal. The result of the comparison is stored in a first storage register. Second data is then written to the memory cell during a write cycle. A high cell signal is read from the memory cell during a second read cycle. A comparison is made between the high cell signal and a high reference signal. The result of the comparison is stored in a second storage register. The results in the first and second storage registers are compared and an output is provided indicating that the memory cell has failed the test if the comparison shows that both the low cell signal is higher than the low reference signal and the high cell signal is lower than the high reference signal.
1. A method for testing the signal window of a memory cell comprising the steps of:
writing first data to a memory cell during a write cycle;
reading a low cell signal from the memory cell during a first read cycle;
comparing the low cell signal to a low reference signal;
storing the result of the comparison in a first storage register;
writing second data to a memory cell during a write cycle;
reading a high cell signal from the memory cell during a second read cycle;
comparing the high cell signal to a high reference signal;
storing the result of the comparison in a second storage register; and
comparing the results in the first and second storage registers and outputting an indication that the memory cell has failed the test if the comparison shows that both the low cell signal is higher than the low reference signal and the high cell signal is lower than the high reference signal.
2. The method of claim 1 , wherein the first data is “0” and the second data is “1”.
3. The method of claim 1 , wherein the memory cell is one of an array of memory cells receiving the first and second data and outputting separate low and high cell signals for comparison with the low and high reference signals.
4. A memory cell signal window testing apparatus comprising:
means for writing first data to a memory cell during a write cycle;
means for reading a low cell signal from the memory cell during a first read cycle;
means for comparing the low cell signal to a low reference signal;
means for storing the result of the comparison in a first storage register;
means for writing second data to a memory cell during a write cycle;
means for reading a high cell signal from the memory cell during a second read cycle;
means for comparing the high cell signal to a high reference signal;
means for storing the result of the comparison in a second storage register; and
means for comparing the results in the low and high storage registers and outputting an indication that the memory cell has failed the test if the comparison shows that both the low cell signal is higher than the low reference signal and the high cell signal is higher than the second reference signal.
5. The apparatus of claim 4 , wherein the first data is “0” and the second data is “1”.
6. The apparatus of claim 4 , wherein the memory cell is one of an array of memory cells receiving the first and second data and outputting separate low and high cell signals for comparison with the low and high reference signals.