Patent Assignment
Reel/Frame 023821/0535
Assignment of Assignor's Interest
Recorded: 2010-01-15
Received: 2010-01-15
Pages: 393
Assignor
INFINEON TECHNOLOGIES AG
Executed: 2006-04-25
Assignee
QIMONDA AG
GUSTAV-HEINEMANN-RING 212, MUNICH, DEX, 81739, GERMANY
Covered Properties
(100)
Tunable Resistor and Method for Operating a Tunable Resistor
Application:
11/541,443 →
Memory Structure and Method of Manufacture
Application:
11/483,264 →
Mram Cell Using Multiple Axes Magnetization and Method of Operation
Application:
11/474,080 →
Mram Structure Using Sacrificial Layer for Anti-Ferromagnet and Method of Manufacture
Application:
11/448,170 →
System and Method for Controlling Constant Power Dissipation
Application:
11/406,073 →
Sense Circuit for Resistive Memory
Application:
11/361,811 →
Memory Device and Method for Reading Data
Application:
11/354,281 →
Method of Forming Dual Interconnects in Manufacturing Mram Cells
Application:
11/289,787 →
Magnetic Memory Array
Application:
11/288,494 →
Memory Write Circuit
Application:
11/273,248 →
Method of Treating a Substrate in Manufacturing a Magnetoresistive Memory Cell
Application:
11/175,386 →
Method of Forming Magnetoresistive Junctions in Manufacturing Mram Cells
Application:
11/145,183 →
Mram Cell with Split Conductive Lines
Application:
11/138,643 →
Memory Having Cap Structure for Magnetoresistive Junction and Method for Structuring the Same
Application:
11/117,854 →
Mram Cell with Domain Wall Switching and Field Select
Application:
11/094,473 →
Double-Decker Mram Cells with Scissor-State Angled Reference Layer Magnetic Anisotropy and Method for Fabricating
Application:
11/054,735 →
Double-Decker Mram Cell with Rotated Reference Layer Magnetizations
Application:
11/054,854 →
Method of Switching an Mram Cell Comprising Bidirectional Current Generation
Application:
11/054,112 →
Method and Device for Varying an Active Duty Cycle of a Wordline
Application:
11/048,836 →
Method of Fabricating Mram Cells
Application:
11/044,729 →
Mram with Coil for Creating Offset Field
Application:
10/998,808 →
Mram with Switchable Ferromagnetic Offset Layer
Application:
10/998,807 →
Circuit Arrangement and Method for Driving Electronic Chips
Application:
10/853,768 →
Method for determining or inspecting a property of a patterned layer
Application:
10/960,327 →
Resistive Memory Cell Random Access Memory Device and Method of Fabrication
Application:
10/955,837 →
Resistive Memory Cell Configuration and Method for Sensing Resistance Values
Application:
10/955,832 →
Content Addressable Memory Cell Including Resistive Memory Elements
Application:
10/955,836 →
Method for Reducing an Overlay Error and Measurement Mark for Carrying Out the Same
Application:
10/952,885 →
Method for Detecting Positioning Errors of Circuit Patterns During the Transfer by Means of a Mask into Layers of a Substrate of a Semiconductor Wafer
Application:
10/951,661 →
Lithographic Mask, and Method for Covering a Mask Layer
Application:
10/952,559 →
Integrated Memory and Method for Functional Testing of the Integrated Memory
Application:
10/948,562 →
Method for Fabricating a Hole Trench Storage Capacitor in a Semiconductor Substrate, and Hole Trench Storage Capacitor
Application:
10/948,574 →
Method for Determining the Relative Positional Accuracy of Two Structure Elements on a Wafer
Application:
10/950,165 →
Circuit for Setting One of a Plurality of Organization Forms of an Integrated Circuit and Method for Operating It
Application:
10/948,557 →
Substrate for Producing a Soldering Connection
Application:
10/950,185 →
Semiconductor Device with Test Circuit Disconnected from Power Supply Connection
Application:
10/946,024 →
Interconnection Element for Bga Housings and Method for Producing the Same
Application:
10/944,684 →
Arrangement for Producing an Electrical Connection Between a Bga Package and a Signal Source, and Method for Producing Such a Connection
Application:
10/944,537 →
Method of Fabricating an Interconnection for Chip Sandwich Arrangements
Application:
10/944,678 →
Method for Forming a Trench in a Layer or a Layer Stack on a Semiconductor Wafer
Application:
10/937,099 →
Differential Amplifier Circuit
Application:
10/934,396 →
Test Structure for a Single-Sided Buried Strap Dram Memory Cell Array
Application:
10/933,497 →
Method and Apparatus for Checking Output Signals of an Integrated Circuit
Application:
10/933,645 →
Integrated Semiconductor Memory
Application:
10/932,888 →
Memory Module and Method for Operating a Memory Module
Application:
10/928,708 →
Sense Amplifier Connecting/Disconnecting Circuit Arrangement and Method for Operating Such a Circuit Arrangement
Application:
10/927,497 →
Driver Device, in Particular for a Semiconductor Device, and Method for Operating a Driver Device
Application:
10/924,207 →
Mram with Vertical Storage Element in Two Layer-Arrangement and Field Sensor
Application:
10/923,639 →
Mram with Vertical Storage Element and Field Sensor
Application:
10/923,651 →
Mram with Magnetic via for Storage of Information and Field Sensor
Application:
10/922,434 →
Circuit for Distribution of an Input Signal to One or More Time Positions
Application:
10/922,624 →
Integrated Circuit for Testing Circuit Components of a Semiconductor Chip
Application:
10/920,204 →
Magnetic Memory with Static Magnetic Offset Field
Application:
10/920,562 →
Circuit and Method for Evaluating and Controlling a Refresh Rate of Memory Cells of a Dynamic Memory
Application:
10/920,206 →
Integrated Memory Having a Test Circuit for Functional Testing of the Memory
Application:
10/920,210 →
Trench Capacitor and Method for Fabricating a Trench Capacitor
Application:
10/920,808 →
Address Decoding Circuit and Method for Addressing a Regular Memory Area and a Redundant Memory Area in a Memory Circuit
Application:
10/920,559 →
Integrated Memory Having a Circuit for Testing the Operation of the Integrated Memory, and Method for Operating the Integrated Memory
Application:
10/917,339 →
Method for Projection of a Circuit Pattern, Which Is Arranged on a Mask, Onto a Semiconductor Wafer
Application:
10/917,426 →
Semiconductor Memory and Method for Operating a Semiconductor Memory
Application:
10/911,230 →
Semiconductor Memory Module
Application:
10/909,205 →
Mram Storage Device
Application:
10/903,722 →
Memory Arrangement in a Computer System
Application:
10/902,160 →
Semiconductor Circuit and Method for Testing, Monitoring and Application-Near Setting of a Semiconductor Circuit
Application:
10/902,105 →
Method for the Lateral Contacting of a Semiconductor Chip
Application:
10/901,931 →
Method of Making Contact with Circuit Units to Be Tested in a Tester and Contact-Making Apparatus for Implementing the Method
Application:
10/900,664 →
Connector
Application:
10/901,934 →
Method for Fabricating Trench Capacitor with Insulation Collar Electrically Connected to Substrate Through Buried Contact, in Particular, for a Semiconductor Memory Cell
Application:
10/901,406 →
Apparatus for Measuring an Exposure Intensity on a Wafer
Application:
10/899,318 →
Method for Fabricating a Gate Structure of a Fet and Gate Structure of a Fet
Application:
10/897,403 →
Dram Cell Array and Memory Cell Arrangement Having Vertical Memory Cells and Methods for Fabricating the Same
Application:
10/898,706 →
Method for Checking Periodic Structures on Lithography Masks
Application:
10/894,640 →
Calibration Device for the Calibration of a Tester Channel of a Tester Device and a Test System
Application:
10/894,942 →
Charge Trapping Memory Cell
Application:
10/894,348 →
Semi-Conductor Memory Component, and a Process for Operating a Semi-Conductor Memory Component
Application:
10/892,546 →
Circuit and Method for Controlling an Access to an Integrated Memory
Application:
10/892,251 →
Semiconductor Memory Module
Application:
10/890,934 →
Method and Apparatus for Producing a Reference Voltage
Application:
10/889,370 →
A Circuit and Method for Testing a Circuit Having Memory Array and Addressing and Control Unit
Application:
10/889,923 →
Apparatus and Method for Reading Out Defect Information Items from an Integrated Chip
Application:
10/888,649 →
Output Driver for an Integrated Circuit and Method for Driving an Output Driver
Application:
10/887,949 →
Method for Fabricating a Trench Structure Which Is Electrically Connected to a Substrate on One Side via a Buried Contact
Application:
10/886,053 →
Semiconductor Memory Module
Application:
10/887,019 →
Semiconductor Memory Module
Application:
10/886,814 →
Integrated Semiconductor Circuit with an Electrically Programmable Switching Element
Application:
10/886,017 →
Integrated Clock Supply Chip for a Memory Module, Memory Module Comprising the Integrated Clock Supply Chip, and Method for Operating the Memory Module Under Test Conditions
Application:
10/886,523 →
Adapter Card for Connection to a Data Bus in a Data Processing Unit and Method for Operating a Ddr Memory Module
Application:
10/884,110 →
Arrangement for Feeding or Dissipating Heat to/from a Semiconductor Substrate for the Purpose of Preparing or Post-Processing a Lithographic Projection Step
Application:
10/883,623 →
Void Free, Silicon Filled Trenches in Semiconductors
Application:
10/882,752 →
Circuit and Method for Refreshing Memory Cells of a Dynamic Memory
Application:
10/881,706 →
Method for Creating Alternating Phase Masks
Application:
10/881,703 →
Circuit and Method for Refreshing Memory Cells of a Dynamic Memory
Application:
10/881,689 →
Method for Wireless Data Interchange Between Circuit Units Within a Package, and Circuit Arrangement for Performing the Method
Application:
10/879,467 →
Semiconductor Memory
Application:
10/878,676 →
Apparatus and Method for Calibrating a Semiconductor Test System
Application:
10/878,681 →
Methods for Producing a Carbon Hard Mask with Bonding Layer for Bonding to Metal
Application:
10/878,458 →
Noninvasive Method for Characterizing and Identifying Embedded Micropatterns
Application:
10/877,262 →
Integrated Circuit Having a Plurality of Output Drivers
Application:
10/877,657 →
Buried Strap Contact for a Storage Capacitor and Method for Fabricating It
Application:
10/875,787 →
System and Method for Determining the Temperature of a Semiconductor Wafer
Application:
10/875,788 →