IP Library Granted Patent US 7,111,263
Granted Patent B2
US 7,111,263 · App. 10/668,684 · Granted Sep 19, 2006

Process for designing and manufacturing semi-conductor memory components, in particular DRAM components

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Quick Facts
Patent No.
US 7,111,263
App. No.
10/668,684
Granted
Sep 19, 2006
Kind
B2
Abstract

The invention relates to a process for designing semi-conductor memory components, especially DRAM components, whereby the process comprises the following steps: designing a first layout for a module of the semi-conductor memory component to be used in a first configuration of the semi-conductor memory component; designing a second layout for the semi-conductor memory component module to be used in a second configuration of the semi-conductor memory component; and using the first layout or the second layout for the total layout of the semi-conductor memory component, depending on the current configuration of the semi-conductor memory component.

Claims (21)

1. A process for designing semi-conductor memory components comprising:

designing of a first layout for a semi-conductor memory module of the semi-conductor memory component to be used for a first configuration of the semi-conductor memory component;

designing of a second layout for the semi-conductor memory module to be used for a second configuration of the semi-conductor memory component, the second layout being different from the first layout;

using the first layout or the second layout for a total layout of the semi-conductor memory component, depending on the particular configuration of the semi-conductor memory component selected from said first or second configurations, together with at least one further layout for at least one further semi-conductor memory module of the semi-conductor memory component that is identical and not dependent on the particular configuration of the semi-conductor memory component,

wherein the first and second layouts for the semi-conductor memory module have essentially the same external dimensions and are arranged at the same locality of the total layout.

2. A process according to claim 1 , in which the process comprises the following additional steps:

designing of a third layout for the semi-conductor memory component module to be used for a third configuration of the semi-conductor memory component;

using of the first, second or third layout for the total layout of the semi-conductor memory components, depending on the particular configuration of the semi-conductor memory component.

3. A process according to claim 2 , wherein the first, second and third layouts for the semi-conductor memory component module all have essentially the same exterior dimensions.

4. A process according to claim 2 , wherein the first, second and third layouts for the semi-conductor memory component module are all essentially arranged at the same locality of the total layout.

5. A process according to claim 1 , in which the process additionally comprises the following steps:

designing the at least one further layout for the at least one further semi-conductor memory module of the semi-conductor memory component.

6. A process according to claim 1 , in which the semi-conductor memory component is a RAM component.

7. A process according to claim 6 , in which the semi-conductor memory component is a DRAM component.

8. A process according to claim 7 , in which the structure of the DRAM component is essentially identical, as with DRAM components configurable by means of fuses or bonds.

9. A process according to claim 1 , in which the module is allocated to a relatively high and/or medium semi-conductor component design abstraction level, in particular to a sub-system, algorithm, register transfer, logic and/or module level.

10. A process according to claim 9 , in which the module is not allocated to the highest semi-conductor component design abstraction level, in particular not to the system and/or CPU/memory level.

11. A process according to claim 1 , which produces a total layout for an SDR-DRAM or DDR-DRAM and/or a DDR2-DRAM component, corresponding with the particular semi-conductor memory component configuration selected in each case.

12. A process according to claim 1 , which produces corresponding with the particular semi-conductor memory component configuration selected in each case a total layout for a semi-conductor memory component with a number of data output bits corresponding with the particular configuration.

13. A process according to claim 1 , which produces corresponding with the particular semi-conductor memory component configuration selected in each case a total layout for a semi-conductor memory component with a data and/or clock pulse rate corresponding with the particular configuration.

14. A process according to claim 1 , which produces corresponding with the particular semi-conductor memory component configuration selected in each case a total layout for a semi-conductor memory component with a voltage supply designed in accordance with the particular configuration.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT 7105729 PREVIOUSLY RECORDED AT REEL: 036827 FRAME: 0885. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jul 26, 2017
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 043336/0694 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 9, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036827/0885 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023796/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2004
From: SCHOLL, STEFAN
To: INFINEON TECHNOLOGIES AG
Reel/Frame 014994/0982 →