Apparatus and method for determining physical properties of a mask blank

1. An apparatus for determining physical properties of a mask blank, comprising:

an illumination device to radiate a predetermined light laterally into the mask blank;

a detection device arranged diametrically opposite to the illumination device to detect the light which has been scattered and/or runs through the mask blank; and

an evaluation device to determine physical properties of the mask blank from the light which has been scattered and/or has run through the mask blank and has been detected in the detection device, wherein

the illumination device and the detection device are rotatable by at least 180 degrees in the plane of the mask blank around the mask blank situated in between.

2. The apparatus according to claim 1 , wherein the illumination device has a laser device or laser diodes.

3. The apparatus according to claim 1 , wherein the illumination device, the mask blank and the detection device are accommodated in a mask production tool.

4. The apparatus according to claim 1 , wherein a data analysis of the light detected by the detection device on the basis of a Fourier transformation to create a characteristic of the mask blank is be provided in the evaluation device.

5. The apparatus according to claim 1 , wherein the mask blank is fixed in a fixing device with an adjustable clamping force.

6. The apparatus according to claim 5 , wherein the fixing device of the mask blank has at least three separately drivable clamping elements.

7. The apparatus according to claim 5 , wherein the fixing of the mask blank in the fixing device is provided by piezoelements.

8. The apparatus according to claim 7 , wherein the clamping force of the fixing device of the mask blank is adjustable depending on the evaluated predetermined properties of the mask blank.

9. A method for determining physical properties of a mask blank, comprising:

radiating a predetermined light perpendicularly to a side wall of the mask blank and laterally into the mask blank by means of an illumination device;

detecting the light, which has been scattered in the mask blank by means of a detection device arranged diametrically opposite to the illumination device;

rotating the detection device and the illumination device around the mask blank by an angle of at least 180 degrees, the mask blank being in the same plane as the detection device and the illumination device;

determining the properties of the mask blank from the detected scattered light in an evaluation device and

storing the properties of the mask blank in a digital storage device.

10. The method according to claim 9 , wherein a data analysis of data forwarded by the detection device based on a Fourier transformation to determine physical properties of the mask blank is executed in the evaluation device.

11. The method according to claim 9 , wherein the determination of physical properties of the mask blank is effected in at least one machining and/or processing tool of the mask blank before the respective machining and/or processing of the mask blank.

12. The method according to claim 9 , wherein properties of the mask blank, once they have been determined, are used as a reference for subsequent process and/or machining steps of the mask blank.

13. The method according to claim 9 , wherein, utilizing the Kerr effect, light which runs through the mask blank in the detection device is detected.

14. The method according to claim 9 , wherein scattering sources and/or flexures in the mask blank are calculated and localized in the evaluation device based on the received data of the detection device.

15. The method according to claim 14 , wherein based on the data of a localized scattering source brought about by a mechanical flexure, an adjustable fixing device, which clamps the mask blank, is driven such that the flexure is reduced.

16. The method according to claim 15 , wherein the adjustable fixing device has electrically drivable piezoelements for clamping the mask blank, by which mechanical stresses and/or flexures in the mask blank are corrected.

17. A method for determining physical properties of a mask blank, comprising:

radiating a predetermined light perpendicularly to a side wall of the mask blank and laterally into the mask blank by an illumination device;

detecting the light, which has been scattered in the mask blank by a detection device arranged diametrically opposite to the illumination device;

rotating the detection device and the illumination device around the mask blank by an angle of at least 180 degrees, the mask blank being in the same plane as the detection device and the illumination device; and

determining the properties of the mask blank from the detected scattered light in an evaluation device,

wherein scattering sources and/or flexures in the mask blank are calculated and localized in the evaluation device based on the received data of the detection device, and

wherein based on the data of a localized scattering source brought about by a mechanical flexure, an adjustable fixing device, which clamps the mask blank, is driven such that the flexure is reduced.

18. The method according to claim 17 , wherein the adjustable fixing device has electrically drivable piezoelements for clamping the mask blank, by which mechanical stresses and/or flexures in the mask blank are corrected.