IP Library Granted Patent US 6,944,086
Granted Patent B2
US 6,944,086 · App. 10/788,704 · Granted Sep 13, 2005

Semiconductor memory device

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Quick Facts
Patent No.
US 6,944,086
App. No.
10/788,704
Granted
Sep 13, 2005
Kind
B2
Abstract

A semiconductor memory device having a bank for storing a data and a port as a data I/O terminal includes a transmitter for delivering the data inputted from the port; a global data bus for flowing an appearing current corresponding to the data outputted from the transmitter; and a receiver for sensing the appearing current by using a current-mirror and delivering the data corresponding to the sensed appearing current into the bank, wherein a swing range of a data bus voltage in response to the appearing current is narrower than a gap between a supply voltage and a ground.

Claims (30)

1. A semiconductor memory device having a bank for storing a data and a port as a data I/O terminal, comprising:

a transmitter for delivering the data inputted from the port;

a global data bus for flowing an appearing current corresponding to the data outputted from the transmitter; and

a receiver for sensing the appearing current by using a current-mirror and delivering the data corresponding to the sensed appearing current into the bank,

wherein the receiver includes a current mirror block for mirroring appearing current of the global data bus to output a mirrored voltage as the data; and a latch block for inverting the mirrored voltage outputted from the current mirror block and latching the converse mirrored voltage as the data to output the data into the port.

2. The semiconductor memory device as recited in claim 1 , wherein a supply voltage is supplied to the current mirror.

3. The semiconductor memory device as recited in claim 2 , wherein

a swing range of a data bus voltage in response to the appearing current is narrower than a gap between the supply voltage and a ground.

4. The semiconductor memory device as recited in claim 3 , wherein the latch block includes:

an inverting block controlled by a data enable signal for inverting the mirrored voltage outputted from the current mirror block; and

a latch having two loop-connected inverters for latching the inverse mirrored voltage as the data to output the data into the port.

5. The semiconductor memory device as recited in claim 3 , wherein the current mirror block includes:

a current mirror for mirroring the appearing current of the global data bus;

a current control block coupled between the current mirror and the global data bus for controlling amount of the appearing current; and

a switching block coupled to the current control block for enabling the output of the current mirror in response to a data control signal.

6. The semiconductor memory device as recited in claim 5 , wherein the current mirror includes:

a first PMOS transistor having a gate, a drain and a source, the gate and drain diode-connected, the source connected to a supply voltage; and

a second PMOS transistor having a gate, a drain and a source, the drain connected to an output node, the source connected to a supply voltage, the gate connected to the gate of the first PMOS transistor.

7. The semiconductor memory device as recited in claim 6 , wherein the current control block includes:

a first NMOS transistor having a gate, a drain and a source, the gate coupled to a reference voltage, the source connected to the drain of the first PMOS transistor and the drain connected to the global data bus; and

a second NMOS transistor having a gate, a drain and a source, the gate coupled to the reference voltage, the source connected to the drain of the second PMOS transistor.

8. The semiconductor memory device as recited in claim 7 , wherein the switching block includes

a third NMOS transistor having a gate, a drain and a source, the gate coupled to a data enable signal, the source connected to the drain of the second NMOS transistor and the drain connected to a ground.

9. The semiconductor memory device as recited in claim 4 , wherein the inverting block includes:

a first PMOS transistor having a gate, a drain and a source, the gate coupled to the inverse data enable signal, the source connected to the supply voltage;

a second PMOS transistor having a gate, a drain and a source, the gate coupled to the first or second data outputted from the mirroring block, the source connected to the drain of the first PMOS transistor, the drain coupled to the latch;

a first NMOS transistor having a gate, a drain and a source, the gate coupled to the data enable signal, the drain connected to a ground; and

a second NMOS transistor having a gate, a drain and a source, the gate coupled to the first or second data outputted from the mirroring block, the drain connected to the source of the first NMOS transistor, the source coupled to the latch.

10. The semiconductor memory device as recited in claim 1 , wherein the transmitter includes

a NMOS transistor, coupled between the global data bus and a ground, having a gate coupled to the data.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded May 21, 2019
From: JEFFERIES FINANCE LLC
To: LATTICE SEMICONDUCTOR CORPORATION; SILICON IMAGE, INC.; SIBEAM, INC.; DVDO, INC.
Reel/Frame 049827/0326 →
SECURITY INTEREST Recorded May 21, 2019
From: LATTICE SEMICONDUCTOR CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 049980/0786 →
MERGER Recorded Oct 12, 2015
From: SILICON IMAGE, INC.
To: LATTICE SEMICONDUCTOR CORPORATION
Reel/Frame 036775/0872 →
SECURITY INTEREST Recorded Mar 19, 2015
From: LATTICE SEMICONDUCTOR CORPORATION; SIBEAM, INC.; SILICON IMAGE, INC.; DVDO, INC.
To: JEFFERIES FINANCE LLC
Reel/Frame 035226/0147 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEES INTEREST TO "ONE-HALF RIGHT, TITLE AND INTEREST IN AND TO THE PATENTS" PREVIOUSLY RECORDED ON REEL 022689 FRAME 0652. ASSIGNOR(S) HEREBY CONFIRMS THE "ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS)". Recorded Nov 17, 2009
From: HYNIX SEMICONDUCTOR, INC.
To: SILICON IMAGE, INC.
Reel/Frame 023525/0715 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2009
From: HYNIX SEMICONDUCTOR, INC.
To: SILICON IMAGE, INC.
Reel/Frame 022689/0652 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2004
From: PARK, BYUNG-IL
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015461/0013 →