IP Library Granted Patent US 7,113,010
Granted Patent B2
US 7,113,010 · App. 10/809,826 · Granted Sep 26, 2006

Clock distortion detector using a synchronous mirror delay circuit

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Quick Facts
Patent No.
US 7,113,010
App. No.
10/809,826
Granted
Sep 26, 2006
Kind
B2
Abstract

The invention refers to a clock distortion detection method, and a clock distortion detector including a first input for receiving a first clock signal, a second input for receiving a second clock signal, and at least one mirror delay element.

Claims (32)

1. A clock distortion detector, comprising:

an input for receiving a second clock signal;

a second input for recieving a second clock signal;

a first mirror delay element comprising at least one input, at least one output, and at least one control input;

and a second mirror delay element comprising at least one input, at least one output, and at least one control input, wherein the output of the first mirror delay element is coupled to the input of the second mirror delay element, and the output of the second mirror delay element is coupled to the input of the first mirror delay element, and the control input of the first mirror delay element and the control input of the second mirror delay are coupled to the input of the clock distortion detector for receiving the first signal.

2. The clock distortion detector of claim 1 , wherein the first and the second mirror delay elements are synchronous mirror delay elements.

3. The clock distortion detector of claim 1 , wherein the first and the second mirror delay elements each additionally comprises two control inputs.

4. The clock distortion detector of claim 3 , wherein the first clock signal is fed to the respective first control inputs, and the second clock signal is fed to the respective second control inputs.

5. The clock distortion detector of claim 4 , wherein the first and the second mirror delay elements are synchronous mirror delay elements.

6. The clock distortion detector of claim 1 , further comprising a test device coupled to the input of the first mirror delay element.

7. The clock distortion detector of claim 6 , wherein the test device additionally is coupled to the output of the first mirror delay element.

8. The clock distortion detector of claim 7 , wherein the test device is configured to compare a signal input into the input of the first mirror delay element with the signal output at the first output of the first mirror delay element.

9. A clock distortion detection method, comprising:

applying a clock signal to a control input of a first mirror delay element; and

applying the clock signal to a control input of a second mirror delay element,

wherein a signal output by the first mirror delay element is applied to the second mirror delay element, and

a signal output by the second mirror delay element is applied to the first mirror delay element.

10. A clock distortion detector, comprising:

a first input for receiving a first clock signal;

a second input for receiving a second clock signal;

at least one mirror delay element;

a first mirror delay element, comprising two inputs and two outputs; and

a second mirror delay element, comprising two inputs and two outputs,

wherein a second output of the first mirror delay element is coupled with a first input of the second mirror delay element, and

a first output of the second mirror delay element is coupled with a second input of the first mirror delay element.

11. The clock distortion detector of claim 10 , wherein the first and the second mirror delay elements are synchronous mirror delay elements.

12. The clock distortion detector of claim 10 , wherein the first and the second mirror delay elements each additionally comprise two control inputs.

13. The clock distortion detector of claim 12 , wherein the first clock signal is fed to the respective first control inputs, and the second clock signal is fed to the respective second control inputs.

14. The clock distortion detector of claim 13 , wherein the first and the second mirror delay elements are synchronous mirror delay elements.

15. The clock distortion detector of claim 10 , further comprising a test device coupled to a first input of the first mirror delay element.

16. The clock distortion detector of claim 15 , wherein the test device additionally is coupled to a first output of the first mirror delay element.

17. The clock distortion detector of claim 16 , wherein the test device is configured to compare a signal input into the input of the first mirror delay element with the signal output at the first output of the first mirror delay element.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036888/0745 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023853/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 26, 2004
From: MINZONI, ALESSANDRO
To: INFINEON TECHNOLOGIES AG
Reel/Frame 015857/0211 →