IP Library Granted Patent US 6,995,422
Granted Patent B2
US 6,995,422 · App. 10/855,778 · Granted Feb 7, 2006

High-density three-dimensional memory

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Quick Facts
Patent No.
US 6,995,422
App. No.
10/855,778
Granted
Feb 7, 2006
Kind
B2
Abstract

An improved method for fabricating a three dimensional monolithic memory with increased density. The method includes forming conductors preferably comprising tungsten, then filling and planarizing; above the conductors forming semiconductor elements preferably comprising two diode portions and an antifuse, then filling and planarizing; and continuing to form conductors and semiconductor elements in multiple stories of memories. The arrangement of processing steps and the choice of materials decreases aspect ratio of each memory cell, improving the reliability of gap fill and preventing etch undercut.

Claims (16)

1. A monolithic three-dimensional memory array comprising area density between 3.3×10 9 cells/mm 2 and 1.0×10 8 cells/mm 2 , wherein each cell comprises a semiconductor element sandwiched between a first conductor and a second conductor, wherein the semiconductor element is formed in a single patterning step, and wherein either of the conductors comprises tungsten.

2. The memory array of claim 1 , wherein the semiconductor element has a substantially cylindrical shape.

3. The memory array of claim 2 , wherein the semiconductor element comprises:

two portions of an incipient diode separated by an antifuse; or

a diode adjacent an antifuse.

4. The memory cell of claim 3 , wherein the semiconductor element comprises:

two portions of an incipient diode separated by an antifuse.

5. The memory cell of claim 3 , wherein the semiconductor element comprises:

a diode adjacent to an antifuse.

6. The memory cell of claim 5 , wherein the antifuse is above the diode.

7. The memory cell of claim 5 , wherein the antifuse is below the diode.

8. A monolithic three dimensional memory array comprising a cubic density greater than about 2.4×10 10 cells/mm 3 , wherein the memory array comprises memory cells, each memory cell comprising an antifuse and a diode.

9. The memory array of claim 8 wherein the cubic density is between 1.4×10 11 cells/mm 3 and 1.7×10 12 cells/mm 3 .

10. The memory array of claim 9 , comprising:

a plurality of substantially parallel first conductors; and

a plurality of first scmiconductor elements over the plurality of first conductors.

Assignments (5)
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038813/0004 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT LISTED PATENT NUMBER 8853569 TO THE CORRECT PATENT NUMBER 8883569 PREVIOUSLY RECORDED ON REEL 038300 FRAME 0665. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 25, 2016
From: SANDISK 3D LLC
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038520/0552 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2016
From: SANDISK 3D LLC.
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038300/0665 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CORRECTIVE MERGER TO ADD PAGES TO THE MERGER DOCUMENT PREVIOUSLY RECORDED PREVIOUSLY RECORDED ON REEL 017544 FRAME 0769. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 2, 2007
From: MATRIX SEMICONDUCTOR, INC.
To: SANDISK 3D LLC
Reel/Frame 018950/0686 →
MERGER Recorded Apr 28, 2006
From: MATRIX SEMICONDUCTOR, INC.
To: SANDISK 3D LLC
Reel/Frame 017544/0769 →