Semi-conductor component test process and a system for testing semi-conductor components
View Patent ↗A semi-conductor component test process, and a system for testing semi-conductor components, with which several different semi-conductor-component tests can be conducted in succession. A computer installation, in particular a test apparatus is provided, with which test result data obtained from a first test is evaluated, and which causes a further test provided after the first test), to be performed in an amended fashion, or to be dispensed with, depending on the test result data obtained from the first test.
1. A method for testing semi-conductor components having a training phase and a testing phase,
the training phase comprising:
performing a first training test on a plurality of semi-conductor components to obtain first training test result data;
performing a second training test on the plurality of semi-conductor components to obtain second training test result data;
performing a third training test on the plurality of semi-conductor components different from the first and the second training test to obtain third training test result data; and
jointly analyzing the first training test result data, the second training test result data and the third training test result data to determine a pattern indicating that third test of the testing phase may be dispensed with; and
the testing phase, comprising:
performing a first test on a semi-conductor component to obtain first test result data;
performing a second test on the semi-conductor component to obtain second test result data; and
jointly analyzing the first and second test result data to predict whether the third test different from the first and second test may be dispensed with based on the pattern determined in the training phase.
2. The method of claim 1 , wherein the jointly analyzing the first and second test result data comprises determining whether the first and second test result data are mutually correlated.
3. A system for testing semi-conductor components, comprising:
at least one testing apparatus to perform a training phase, including:
performing a first training test on a plurality of semi-conductor components to obtain first training test result data;
performing a second training test on the plurality of semi-conductor components to obtain second training test result data;
performing a third training test on the plurality of semi-conductor components different from the first and the second training test to obtain third training test result data; and
jointly analyzing the first training test result data) the second training test result data and the third training test result data to determine a pattern indicating that a third test of a testing phase may be dispensed with; and
the at least one testing apparatus performing the testing phase, including:
performing a first test on a semi-conductor component to obtain first test result data;
performing a second test on the semi-conductor component to obtain second test result data; and
jointly analyzing the first and second test result data to predict whether the third test different from the first and second test may be dispensed with based on the pattern determined in the training phase.