IP Library Granted Patent US 7,005,750
Granted Patent B2
US 7,005,750 · App. 10/902,003 · Granted Feb 28, 2006

Substrate with reinforced contact pad structure

Assignee: Advanced Semiconductor Engineering, Inc.
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Quick Facts
Patent No.
US 7,005,750
App. No.
10/902,003
Granted
Feb 28, 2006
Kind
B2
Abstract

A substrate with reinforced contact pad structure includes a metal wiring layer and a solder mask formed over its surface. The metal wiring layer includes at least a NSMD (Non-Solder Mask Defined) type contact pad, a trace and an extension. The extension connects the contact pad and the trace, and has an upper surface which is covered by the solder mask so as to enhance the connecting strength between the trace and the contact pad and to improve the position stability of the NSMD type contact pad on the substrate. In an embodiment, the contact pad is circular for bonding a bump or a solder ball. The first extension is fan-shaped. The extension also has a sidewall exposed out of the solder mask.

Claims (20)

1. A substrate with reinforced contact pad structure, comprising:

a substrate having a surface;

a metal wiring layer disposed on the surface of the substrate, the metal wiring layer including at least a contact pad, a trace and a first extension connecting the contact pad and the trace, the contact pad having a bonding surface and a sidewall; and

a solder mask formed over the surface of the substrate, the solder mask having at least an opening;

wherein the bonding surface and the sidewall of the contact pad are exposed out of the opening of the solder mask, the upper surface of the first extension and the trace are covered by the solder mask, wherein the first extension has a border along the opening longer than the width of the trace.

2. The substrate of claim 1 , wherein the opening of the solder mask is larger than the contact pad.

3. The substrate of claim 1 , wherein the bonding surface of the contact pad is circular.

4. The substrate of claim 3 , wherein the first extension has an arc shape.

5. The substrate of claim 1 , wherein the metal wiring layer includes a second extension connecting the contact pad opposing to the first extension, the upper surface of the second extension is covered by the solder mask.

6. The substrate of claim 1 , wherein the first extension has a sidewall exposed out of the opening.

7. The substrate of claim 1 , wherein there is a V-shaped indentation between the sidewalls of the contact pad and the first extension.

8. The substrate of claim 1 , wherein the contact pad is a Non-Solder Mask Defined pad.

9. The substrate of claim 1 , wherein the first extension has a shape in a manner that the trace is completely sealed by the solder mask.

10. A substrate with reinforced contact pad structure, comprising:

a substrate having a surface;

a metal wiring layer disposed on the surface of the substrate, the metal wiring layer including at least a contact pad, a trace and a first extension connecting the contact pad and the trace, the contact pad having a bonding surface and a sidewall; and

a solder mask formed over the surface of the substrate, the solder mask having at least an opening;

wherein the bonding surface and the sidewall of the contact pad are exposed out of the opening of the solder mask, the upper surface of the first extension and the trace are covered by the solder mask, wherein the opening of the solder mask includes a circular opening correspond to the bonding surface and at least an extensive gap, the extensive gap is formed in staggered layout corresponding to the first extension to expose the sidewall of the contact pad.

11. The substrate of claim 10 , wherein the first extension has a sidewall exposed out of the extensive gap.

12. The substrate of claim 10 , wherein the extensive gap has an arc shape.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2008
From: ADVANCED SEMICONDUCTOR ENGINEERING, INC.
To: ASE (SHANGHAI) INC.
Reel/Frame 021518/0063 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2004
From: LIU, SHENG-TSUNG
To: ADVANCED SEMICONDUCTOR ENGINEERING, INC.
Reel/Frame 015641/0807 →
Priority Claims (1)
TW 92121210 A · Aug 1, 2003 · national
Continuity (1)
Related Publication 20050023679A1 · Feb 3, 2005