IP Library Patent Application 10921497
Patent Application
App. No. 10/921,497

Multi-level redistribution layer traces for reducing current crowding in flipchip solder bumps

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Quick Facts
Patent No.
US None
App. No.
10/921,497
Abstract

A multi-level redistribution layer trace reduces current crowding in solder bumps of an integrated circuit package. A multi-level redistribution layer trace for an integrated circuit die includes a redistribution layer trace formed on the integrated circuit die in each of a plurality of electrically conductive layers and an I/O pad formed at a termination of the redistribution layer trace so that the I/O pad extends through each of the plurality of electrically conductive layers to form an electrical junction between the termination of the redistribution layer trace and the I/O pad in each of the plurality of electrically conductive layers. The redistribution layer trace may also be slotted to divide current flow horizontally at the electrical junction between the termination of the redistribution layer trace and the I/O pad in each of the plurality of electrically conductive layers.

Claims (8)

1 . A multi-level redistribution layer trace for an integrated circuit die comprising:

a redistribution layer trace formed on the integrated circuit die in an electrically conductive layer of the integrated circuit die;

an I/O pad extending through the electrically conductive layer to form an electrical junction between the termination of the redistribution layer trace and the I/O pad; and

a slot formed in the redistribution layer trace to divide the current flow horizontally at the electrical junction.

2 . A method of making a multi-level redistribution layer trace of an integrated circuit die comprising steps for:

forming a redistribution layer trace in an electrically conductive layer of the integrated circuit die;

forming an I/O pad on the integrated circuit die that extends through the electrically conductive layer to form an electrical junction between the redistribution layer trace and the I/O pad; and

forming a slot in the redistribution layer trace that extends into the redistribution layer trace from the electrical junction between the redistribution layer trace and the I/O pad.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059723/0382 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044886/0766 →
MERGER Recorded Feb 19, 2008
From: LSI SUBSIDIARY CORP.
To: LSI CORPORATION
Reel/Frame 020548/0977 →