Temperature-dependent DRAM self-refresh circuit
View Patent ↗A device comprising a temperature-dependent self refresh circuit for a memory device is provided where the self refresh circuit includes: a temperature sensor circuit for providing an output that reflects an operation temperature; means for switching the temperature sensor circuit to a low power state during a self refresh operation; an encoder for encoding temperature data from said output; and a programmable oscillator responsive to the encoded data to provide a temperature-dependent refresh signal for the self refresh operation.
1. A device comprising a temperature-dependent self refresh circuit for a memory devices said self refresh circuit comprising:
a temperature sensor circuit for providing an output that reflects an operation temperature;
means for switching said temperature sensor circuit to a low power state during a self refresh operation;
an encoder for encoding temperature data from said output; and
a programmable oscillator responsive to said encoded data to provide a temperature-dependent refresh signal for said self refresh operation.
2. The device of claim 1 , wherein said self refresh circuit further comprises:
a sample-and-latch circuit coupled between said temperature sensor circuit and said encoder, said sample-and-latch circuit sampling a signal indicative of said output of said temperature sensor circuit to provide said temperature data for said encoder, said sample and latch circuit further latching said temperature data for said encoder when said temperature sensor circuit is switched to said low power state.
3. The device of claim 2 ,
wherein said temperature sensor circuit comprises means for providing a temperature dependent voltage signal,
said device further comprising a comparison circuit for comparing said temperature dependent voltage with a plurality of reference voltages, whereby said comparison circuit provides said signal indicative of said output of said temperature sensor circuit.
4. The device of claim 1 , wherein said switching means comprises a switch coupled between a power supply and said sensor circuit, said switch being responsive to an enable signal indicating said self refresh operation.
5. The device of claim 4 , wherein said switch comprises a MOS transistor biased with said enable signal indicating said self refresh operation.
6. The device of claim 1 , wherein said switching means is responsive to an enable signal indicating said self refresh operation, wherein said enable signal switches logic states at least once during said self refresh operation for a time period, whereby said switching means switches said sensor circuit on for said time period.
7. The device of claim 6 , further comprising means for generating said enable signal.
8. The device of claim 1 , wherein said encoder comprises a plurality of NAND gates, each of said NAND gates providing an output representative of said operation temperature being within a respective temperature range.
9. The device of claim 1 , wherein said programmable oscillator comprises a pulse generator and means responsive to said encoded data for coupling said pulse generator to one of a plurality of control clock signals.
10. The device of claim 9 , further comprising means for generating said plurality of control clock signals.
11. The device of claim 1 , further comprising a DRAM memory array.
12. A method of generating a temperature-dependent refresh signal for a memory device, said method comprising the steps of:
providing a temperature sensor for providing an output that reflects an operating temperature of said device;
switching said temperature sensor to a low power state during a self refresh operation;
encoding temperature data from said output; and
utilizing said encoded data to program an oscillator to provide a temperature-dependent refresh signal for said self refresh operation.
13. The method of claim 12 , further comprising the steps of:
sampling a signal indicative of said output from said temperature sensor to provide said temperature data for encoding; and
latching said temperature data for encoding when said temperature sensor circuit is switched to said low power state.
14. The method of claim 12 , said output form said temperature sensor circuit comprises a temperature dependent voltage signal, the method further comprising the steps of:
comparing said temperature dependent voltage signal with a plurality of reference voltages, whereby said signal indicative of said output of said temperature sensor circuit is provided.
15. The method of claim 12 , wherein said switching step is performed responsive to an enable signal indicating said self refresh operation.
16. The method of claim 14 , wherein said enable signal switches logic states at least once during said self refresh operation for a time period, whereby said sensor circuit is switched on for said time period.
17. The method of claim 12 , wherein said memory device comprises a DRAM memory device.
18. A memory device comprising:
a DRAM memory array; and
a temperature-dependent self refresh circuit for said DRAM memory array, said self refresh circuit comprising:
a temperature sensor circuit for providing an output that reflects an operating temperature of said DRAM memory array;
means for switching said temperature sensor circuit to a low power state responsive to an enable signal indicating a self refresh operation;
an encoder for encoding temperature data from said output;
a sample and latch circuit coupled to sample a signal indicative of said output of said temperature sensor circuit to provide temperature data to said encoder, said sample and latch circuit further latching said temperature data for said encoder when said temperature sensor circuit is switched to said low power state; and
a programmable oscillator responsive to said encoded data to provide a temperature-dependent refresh signal for said self refresh operation.
19. The device of claim 18 ,
wherein said output of said temperature sensor circuit comprises a temperature dependent voltage signal,
said device further comprising a comparison circuit for comparing said temperature dependent voltage with a plurality of reference voltages, whereby said comparison circuit provides said signal indicative of said output of said temperature sensor circuit for said sample and latch circuit.
20. The device of claim 18 , wherein said enable signal switches logic states at least once during said self refresh operation for a time period, whereby said switching means switches said sensor circuit on for said time period.
21. The device of claim 20 , further comprising means for generating said enable signal.
22. The device of claim 18 , wherein said encoder comprises a plurality of NAND gates, each of said NAND gates providing an output representative of said operation temperature being within a respective temperature range.
23. The device of claim 18 , wherein said programmable oscillator comprises a pulse generator and means responsive to said encoded data for coupling said pulse generator to one of a plurality of control clock signals.
24. The device of claim 23 , further comprising means for generating said plurality of control clock signals.