Method for testing circuit units to be tested by means of majority decisions and test device for performing the method

1. Test device for testing circuit units to be tested, having:

a) connecting units for connecting the circuit units to be tested to the test device;

b) a test system, which

(i) writes test data to the circuit units to be tested;

(ii) reads out measurement data generated by the circuit units to be tested in a manner dependent on the test data written in; and

(iii) compares the measurement data read out with defined expected data and provides test result data in a manner dependent on the comparison; and

c) an output unit for outputting the test result data,

characterized in that

the test device further has:

d) a determining unit for determining those of the measurement data which correspond for a predeterminable number of circuit units to be tested, and for defining the corresponding measurement data as the expected data; and

e) comparison units for comparing the measurement data generated by the circuit units to be tested in a manner dependent on the test data written in with the expected data in order to obtain comparison data.

2. Device according to claim 1 , characterized in that the connecting units for connecting the circuit units to be tested to the test device in each case comprise a predetermined number m of tester channels.

3. Device according to claim 1 , characterized in that the predeterminable number of circuit units to be tested for which the measurement data correspond, said predeterminable number being determined in the determining unit, comprises a majority of the circuit units to be tested.

4. Device according to claim 1 , characterized in that provision is made of a buffer storage unit for buffer storing the expected data determined.

5. Device according to claim 1 , characterized in that a multiplexing unit is provided, which switches through the test data to the circuit units to be tested and outputs to the corresponding comparison units the measurement data generated by the circuit units to be tested in a manner dependent on the test data switched through.

6. Device according to claim 5 , characterized in that the multiplexing unit switches through the test data to the circuit units to be tested in a manner dependent on a write-read signal fed to the multiplexing unit.

7. Device according to claim 6 , characterized in that the multiplexing unit outputs to the corresponding comparison units, in a manner dependent on a write-read signal fed to the multiplexing unit, the measurement data generated by the circuit units to be tested in a manner dependent on the test data switched through.

8. Device according to claim 1 , characterized in that provision is made of a comparison data storage unit for storing the comparison data.

9. Device according to claim 1 , characterized in that provision is made of at least three connecting units for connecting at least three circuit units to be tested to the test device.

10. Test method for testing circuit units to be tested in a test device, having the following steps:

a) connection of the circuit units to be tested to the test device by means of connecting units;

b) performance of test procedures by means of a test system, the test system:

(i) writes test data to the circuit units to be tested;

(ii) reads out measurement data generated by the circuit units to be tested in a manner dependent on the test data written in; and

(iii) compares the measurement data read out with defined expected data and provides test result data in a manner dependent on the comparison; and

c) outputting of the test result data by means of an output unit,

characterized in that

the method further comprises the following steps:

d) determination of those of the measurement data which correspond for a predeterminable number of circuit units to be tested, by means of a determining unit;

e) definition of the corresponding measurement data as the expected data by means of the determining unit; and

f) comparison of the measurement data generated by the circuit units to be tested in a manner dependent on the test data written in with the expected data by means of comparison units in order to obtain comparison data.

11. Method according to claim 10 , characterized in that a majority decision is performed in the determining unit in such a way that the predeterminable number of circuit units to be tested for which the measurement data correspond, said number being determined in the determining unit, is defined as a plurality of the circuit units to be tested.

12. Method according to claim 10 , characterized in that the expected data determined by means of the determining unit are buffer-stored in a buffer storage unit before they are output to the comparison units.

13. Method according to claim 10 , characterized in that the test data are switched through to the circuit units to be tested by means of a multiplexing unit, and in that the measurement data generated by the circuit units to be tested in a manner dependent on the test data switched through are output to the corresponding comparison units.

14. Device according to claim 13 , characterized in that the test data are switched through to the circuit units to be tested by means of the multiplexing unit in a manner dependent on a write-read signal fed to the multiplexing unit.

15. Device according to claim 14 , characterized in that the measurement data generated by the circuit units to be tested in a manner dependent on the test data switched through are output to the corresponding comparison units by means of the multiplexing unit in a manner dependent on a write-signal fed to the multiplexing unit.

16. Method according to claim 10 , characterized in that the comparison data are buffer-stored by means of a comparison data storage unit.