IP Library Granted Patent US 7,605,475
Granted Patent B2
US 7,605,475 · App. 11/086,990 · Granted Oct 20, 2009

Semiconductor device

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Quick Facts
Patent No.
US 7,605,475
App. No.
11/086,990
Granted
Oct 20, 2009
Kind
B2
Abstract

The invention reduces outside dimensions of a semiconductor device mounted with a semiconductor die on an external connection medium and minimizes degradation of electrical characteristics of the semiconductor device. The semiconductor device of the invention having a semiconductor die and a lead frame with a plurality of lead terminals has following features. The semiconductor die has a plurality of pad electrodes formed on its front surface, at least one via hole penetrating the semiconductor die, a columnar electrode electrically connected with the pad electrode through the via hole, and a protrusion electrode electrically connected with the columnar electrode. At least one of the lead terminals of the lead frame is formed extending to a position connectable with the protrusion electrode, being connected with the protrusion electrode.

Claims (21)

1. A semiconductor device comprising:

a die made of a semiconductor and having a via hole;

a pad electrode disposed on a front surface of the semiconductor die;

a lead comprising a plurality of lead terminals and not having an island portion to support the semiconductor die;

a wiring layer disposed on a back surface of the semiconductor die and connected to the pad electrode through the via hole, the back surface facing the lead; and

a protrusion electrode disposed on the back surface so as to be physically in contact with the wiring layer,

wherein at least one of the lead terminals is in physically contact with the protrusion electrode,

the wiring layer extends away from the protrusion electrode, and

the lead terminal physically in contact with the protrusion electrode extends inwardly in a direction parallel to the front surface of the semiconductor die so as not to overlap the via hole.

2. The semiconductor device of claim 1 , wherein the protrusion electrode is disposed away from the via hole.

3. The semiconductor device of claim 1 , further comprising a pad electrode disposed on a front surface of the semiconductor die and connected to one of the lead terminals with a wire.

4. The semiconductor device of claim 1 , wherein none of the lead terminals of the lead reaches an area under a central portion of the die.

5. A semiconductor device comprising:

a die made of a semiconductor and having a via hole;

a pad electrode disposed on a front surface of the semiconductor die;

a lead body comprising a plurality of elongated lead terminals that converge into a center of the lead body so as to leave an empty space in the center of the lead body;

a wiring layer disposed on a back surface of the semiconductor die and connected to the pad electrode through the via hole, the back surface facing the lead body; and

a protrusion electrode disposed on the back surface so as to be in contact with the wiring layer,

wherein at least one of the lead terminals is physically in contact with the protrusion electrode,

the wiring layer extends away from the protrusion electrode, and

the lead terminal physically in contact with the protrusion electrode extends toward the center of the lead body in a direction parallel to the front surface of the semiconductor die so as not to overlap the via hole.

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2014
From: KANTO SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 033713/0296 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →