IP Library Granted Patent US 8,044,425
Granted Patent B2
US 8,044,425 · App. 11/191,111 · Granted Oct 25, 2011

Ultra-thin ohmic contacts for p-type nitride light emitting devices

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Quick Facts
Patent No.
US 8,044,425
App. No.
11/191,111
Granted
Oct 25, 2011
Kind
B2
Abstract

A semiconductor based Light Emitting Device (LED) can include a p-type nitride layer and a metal ohmic contact, on the p-type nitride layer. The metal ohmic contact can have an average thickness of less than about 25 Å and a specific contact resistivity less than about 10 −3 ohm-cm 2 .

Claims (23)

1. A semiconductor based Light Emitting Device (LED) comprising:

a p-type nitride layer; and

a metal ohmic contact, on the p-type nitride layer, the metal ohmic contact comprising an average thickness of less than about 5 Å and a specific contact resistivity less than about 10 −3 ohm-cm 2 .

2. An LED according to claim 1 wherein the metal ohmic contact covers about 100% of the p-type nitride layer.

3. An LED according to claim 1 wherein the metal ohmic contact covers less than 100% of the p-type nitride layer measured via an Auger analysis of the metal ohmic contact.

4. An LED according to claim 2 wherein the metal ohmic contact comprises Pt.

5. An LED according to claim 1 wherein the metal ohmic contact covers less than about 70% of the p-type nitride layer measured via an Auger analysis of the metal ohmic contact.

6. An LED according to claim 5 wherein the metal ohmic contact covers a portion of the p-type nitride layer and a remaining portion of the p-type nitride layer is un-covered by the metal ohmic contact.

7. An LED according to claim 1 wherein the metal ohmic contact covers less than about 47% of the p-type nitride layer measured via an Auger analysis of the metal ohmic contact.

8. An LED according to claim 7 wherein a normalized transmissivity of the metal ohmic contact comprises at least about 92% at a measurement wavelength of about 350 nm.

9. An LED according to claim 7 wherein the metal ohmic contact covers a portion of the p-type nitride layer and a remaining portion of the p-type nitride layer is un-covered by the metal ohmic contact.

10. An LED according to claim 1 wherein the metal ohmic contact comprises an average thickness less than about 3 Å.

11. An LED according to claim 10 wherein the metal ohmic contact covers less than about 28% of the p-type nitride layer measured via an Auger analysis of the metal ohmic contact.

12. An LED according to claim 11 wherein a normalized transmissivity of the metal ohmic contact comprises about 94% to about 96% at a measurement wavelength of about 350 nm.

13. An LED according to claim 11 wherein the metal ohmic contact covers a portion of the p-type nitride layer and a remaining portion of the p-type nitride layer is un-covered by the metal ohmic contact.

14. An LED according to claim 1 wherein the metal ohmic contact comprises an average thickness of about 1 Å.

15. An LED according to claim 14 wherein the metal ohmic contact covers less than about 13% of the p-type nitride layer measured via an Auger analysis of the metal ohmic contact.

16. An LED according to claim 15 wherein a normalized transmissivity of the metal ohmic contact comprises more than about 98% at a measurement wavelength of about 350 nm.

17. An LED according to claim 15 wherein the metal ohmic contact covers a portion of the p-type nitride layer and a remaining portion of the p-type nitride layer is un-covered by the metal ohmic contact.

18. An LED according to claim 1 wherein the metal ohmic contact comprises platinum, rhodium, zinc oxide, palladium, palladium oxide, titanium, nickel/gold, nickel oxide/gold, nickel oxide/platinum and/or titanium/gold.

19. An LED according to claim 1 further comprising:

a reflector beneath the metal ohmic contact configured to reflect light emitted through the metal ohmic contact back toward the metal ohmic contact.

20. An LED according to claim 19 wherein the reflector comprises a conductive reflector configured to provide current spreading.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF THE ASSIGNEE PREVIOUSLY RECORDED ON REEL 56012 FRAME 200. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jul 9, 2025
From: CREE, INC.
To: CREELED, INC.
Reel/Frame 071874/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 30, 2025
From: CREELED, INC.; PENGUIN SOLUTIONS CORPORATION (DE); SMART EMBEDDED COMPUTING, INC.; SMART HIGH RELIABILITY SOLUTIONS LLC; SMART MODULAR TECHNOLOGIES, INC.; PENGUIN COMPUTING, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 071755/0001 →
RELEASE OF PATENT SECURITY INTEREST RECORDED AT R/F 058983/0001 Recorded Jun 25, 2025
From: CITIZENS BANK, N.A.
To: SMART MODULAR TECHNOLOGIES, INC.; SMART EMBEDDED COMPUTING, INC.; SMART HIGH RELIABILITY SOLUTIONS LLC; CREELED, INC.
Reel/Frame 071725/0207 →
SECURITY INTEREST Recorded Feb 7, 2022
From: SMART MODULAR TECHNOLOGIES, INC.; SMART HIGH RELIABILITY SOLUTIONS, LLC; SMART EMBEDDED COMPUTING, INC.; CREELED, INC.
To: CITIZENS BANK, N.A.
Reel/Frame 058983/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2021
From: CREE, INC.
To: CREE LED, INC.
Reel/Frame 056012/0200 →
CONFIRMATORY LICENSE Recorded Jan 29, 2007
From: CREE, INC.
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 018823/0135 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2005
From: RAFFETTO, MARK; BHARATHAN, JAYESH; HABERERN, KEVIN; BERGMANN, MICHAEL; EMERSON, DAVID; IBBETSON, JAMES; LI, TING
To: CREE, INC.
Reel/Frame 017003/0560 →