IP Library Granted Patent US 7,300,850
Granted Patent B2
US 7,300,850 · App. 11/238,868 · Granted Nov 27, 2007

Method of forming a self-aligned transistor

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Quick Facts
Patent No.
US 7,300,850
App. No.
11/238,868
Granted
Nov 27, 2007
Kind
B2
Abstract

In one embodiment, a transistor is formed to use two conductors to make electrical connection to one of the active regions of the transistor.

Claims (27)

1. A method of forming a transistor comprising:

providing a semiconductor substrate having a first surface;

forming an oxide layer overlying at least a portion of the first surface of the semiconductor substrate;

forming a first conductor having a second surface overlying a portion of both the oxide layer and a first portion of the first surface, and having a sidewall;

removing a portion of the oxide layer and forming a second conductor extending from the second surface to electrically contact the first portion of the first surface wherein the second conductor is overlying the oxide layer and is not on the sidewall of the first conductor;

forming a first doped region in the first surface and underlying the second conductor;

forming a second doped region on a second portion of the first surface;

forming a third conductor overlying and electrically contacting the second doped region.

2. The method of claim 1 wherein forming the second conductor extending from the second surface includes forming an opening through the first conductor that exposes the sidewall of the first conductor, forming a protective spacer on the sidewall of the first conductor, forming a recess underlying the first conductor, and filling the recess with a conductor material.

3. The method of claim 2 further including forming a dielectric overlying the first conductor prior to forming the second conductor, forming the opening through the dielectric and exposing a sidewall of the dielectric and the sidewall of the first conductor, and forming the protective spacer on the sidewall of the dielectric and on the sidewall of the first conductor.

4. The method of claim 1 wherein forming the first doped region includes forming the first doped region of a first conductivity type and forming the second doped region of a second conductivity type.

5. A method of forming a semiconductor device comprising:

providing a semiconductor substrate having a first surface;

forming a first conductor having a second surface overlying a first portion of the first surface and having a sidewall;

forming a second conductor on the second surface after forming the first conductor wherein the second conductor is electrically contacting a first doped region on the first portion of the first surface of the semiconductor substrate including forming the second conductor extending from a portion of the second surface and not on the sidewall of the first conductor;

forming a second doped region on a second portion of the first surface and electrically contacting the first doped region; and

forming a third conductor overlying and electrically contacting the second doped region and not touching the first conductor or the second conductor.

6. The method of claim 5 wherein forming the second conductor on the second surface and electrically contacting the first doped region includes forming the second conductor from a material having a dopant of a first conductivity type and diffusing a portion of the dopant from the second conductor into the first surface to form the first doped region.

7. The method of claim 5 wherein forming the second doped region includes implanting dopants of a second conductivity type into the second portion of the first surface.

8. The method of claim 5 wherein forming the second doped region includes forming an opening through the first conductor and exposing the second portion of the first surface.

9. A method of forming a semiconductor device comprising:

providing a semiconductor substrate having a first surface;

forming a first conductor having a second surface overlying a first portion of the first surface and having a sidewall;

forming a protective spacer on the sidewall of the first conductor;

subsequently forming a second conductor on the second surface and electrically contacting a first doped region on the first portion of the first surface of the semiconductor substrate including forming the second conductor extending from a portion of the second surface and not on the sidewall of the first conductor;

forming a second doped region on a second portion of the first surface and electrically contacting the first doped region; and

forming a third conductor overlying and electrically contacting the second doped region and not touching the first conductor or the second conductor.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
RELEASE OF SECURITY INTEREST Recorded Sep 4, 2014
From: JPMORGAN CHASE BANK, N.A.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 033686/0092 →