IP Library Granted Patent US 7,279,983
Granted Patent B2
US 7,279,983 · App. 11/282,021 · Granted Oct 9, 2007

Output amplifier structure with bias compensation

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,279,983
App. No.
11/282,021
Granted
Oct 9, 2007
Kind
B2
Abstract

In one embodiment, an output transistor and a bias compensation device are placed in proximity to each other on the same package substrate. The bias compensation device is electrically isolated but thermally coupled to the output transistor, and is configured to provide a output signal for adjusting bias to the output transistor.

Claims (36)

1. An output amplifier structure comprising:

a flag having a major surface;

an amplifier device electrically and thermally coupled to one portion of the flag;

a bias compensation device for sensing thermal characteristics of the amplifier device coupled to another portion of the flag and spaced apart from the amplifier device, wherein the bias compensation device is thermally coupled to the flag and electrically isolated from the flag;

a plurality of conductive leads in proximity to the flag;

connective structures electrically coupling the amplifier device and the bias compensation device to the plurality of conductive leads; and

an encapsulating layer formed overlying the amplifier device and the bias compensation device.

2. The structure of claim 1 , wherein the amplifier device comprises a bipolar transistor.

3. The structure of claim 2 , wherein the bias compensation device comprises a diode.

4. The structure of claim 3 , wherein the diode comprises an ultra-fast diode.

5. The structure of claim 1 , wherein the bias compensation device is attached to the flag with an attach layer having a thermal conductivity from about 0.25 W/m·K to about 0.5 W/m·K, and volume resistivity greater than about 1.0×10 9 ohm-cm.

6. The structure of claim 1 , wherein the bias compensation device is spaced a distance from about 3.5×10 −3 meters to about 4.0×10 −3 meters from the amplifier device.

7. The structure of claim 1 , wherein the bias compensation is electrically coupled to a conductive slug, and wherein the conductive slug is thermally coupled to the flag but electrically isolated therefrom.

8. The structure of claim 7 , wherein the conductive slug is electrically coupled to one of the plurality of conductive leads.

9. The structure of claim 7 , wherein the conductive slug includes a structure for preventing flow of attach material.

10. An amplifier device with bias compensation comprising:

a die attach paddle having a major surface, wherein the die attach paddle is electrically and thermally conductive;

a plurality of conductive leads in spaced relationship to the die attach paddle;

an output switching device electrically and thermally couple to one portion of the die attach paddle and further electrically coupled to at least one of the plurality of conductive leads;

a thermal bias device thermally coupled to the die attach paddle and spaced a distance from the output switching device, the thermal bias device for sensing temperature changes bias in the output switching device and providing the bias compensation therefore, wherein the thermal bias device is electrically isolated from the die attach paddle; and

an encapsulating layer passivating the output switching device and the thermal bias device.

11. The device of claim 10 , wherein the output switching device comprises a bipolar transistor.

12. The device of claim 10 , wherein the thermal bias device comprises a diode.

13. The device of claim 10 , wherein the thermal bias device comprises an ultra-fast switching diode.

14. The device of claim 10 , wherein the thermal bias device is coupled to an electrically and thermally conductive slug, and wherein the conductive slug is thermally coupled to the die attach paddle and electrically isolated from the die attach paddle.

15. The device of claim 14 , wherein the conductive slug is attached to the die attach paddle with a die attach epoxy layer that is electrically isolative and thermally conductive.

16. A method for forming an amplifier device comprising the steps of:

providing a die attach paddle having a major surface, wherein the die attach paddle is electrically and thermally conductive, and having a plurality of conductive leads in spaced relationship thereto;

attaching an output switching device to one portion of the die attach paddle with an electrically and thermally conductive attach layer;

attaching a thermal bias device to another portion of the die attach paddle and spaced a distance from the output switching device with a thermally conductive and electrically isolative attach layer;

coupling the output switching device and the thermal bias device to the plurality of conductive leads; and

forming an encapsulating layer overlying the output switching device and the thermal bias device.

17. The method of claim 16 , wherein the step of attaching the output switching device includes attaching a bipolar transistor.

18. The method of claim 16 , wherein the step of attaching the thermal bias device includes attaching an ultra-fast switching diode.

19. The method of claim 16 , wherein the step of attaching the thermal bias device includes attaching the thermal bias device a distance from about 3.5×10 −3 meters to about 4.0×10 −3 meters from the output switching device.

20. The method of claim 16 , further comprising the step of attaching the thermal bias device to an electrically and thermally conductive slug, and attaching the conductive slug to the die attach paddle with the thermally conductive and electrically isolative attach layer.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
RELEASE OF SECURITY INTEREST Recorded Sep 4, 2014
From: JPMORGAN CHASE BANK, N.A.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 033686/0092 →