Input circuit for an integrated circuit

1. An integrated circuit, comprising:

a functional circuit;

a setting memory for storing a setting data item; and

an input circuit for receiving signals via an input terminal, the input circuit comprising a first receiving circuit having a first hysteresis and a second receiving circuit having a second hysteresis; the input circuit selectively connecting either the first or the second receiving circuit to the input terminal depending on a value of the setting data item in order to receive the signals and to provide the functional circuit with the signals.

2. The circuit of claim 1 , wherein the input circuit further comprises a switch which connects either the first or the second receiving circuit to the input terminal depending on the value of the setting data item.

3. The circuit of claim 1 , further comprising a setting circuit coupled to the setting memory and configured to set the value of the setting data item in the setting memory to a first value during a first mode of operation of the functional circuit and set the value of the setting data item in the setting memory to a second value during a second mode of operation of the functional circuit.

4. The circuit of claim 1 , further comprising a setting circuit coupled to the setting memory and configured to set the value of the setting data item in the setting memory to one of a first value and a second value; wherein the setting memory is configured in such a manner that the setting memory permanently stores the second value after the second value has been written to the setting memory.

5. The circuit of claim 1 , further comprising a setting circuit coupled to the setting memory and configured to set the value of the setting data item in the setting memory to one of a first value and a second value; wherein the setting memory is configured to be incapable of being written to further after the second value has been written to the setting memory.

6. The circuit of claim 1 , further comprising a setting circuit coupled to the setting memory and configured to set the value of the setting data item in the setting memory to one of a first value and a second value; wherein the setting circuit is configured to be incapable of being writing to the setting memory after the second value has been written to the setting memory.

7. The circuit of claim 1 , further comprising a setting circuit coupled to the setting memory and configured to set the value of the setting data item in the setting memory to one of a first value and a second value; wherein the setting memory comprises an electrical fuse rendering the setting memory incapable of being written to further after the second value has been written to the setting memory.

8. The circuit of claim 1 , wherein the first hysteresis of the first receiving circuit is selected such that, in a burn-in test operation, noisy signals having a low edge steepness are reliably received, and the second hysteresis of the second receiving circuit is selected such that signals having a high edge steepness are detected more rapidly than in the first receiving circuit.

9. The circuit of claim 1 , wherein the first hysteresis of the first receiving circuit is higher than the second hysteresis of the second receiving circuit.

10. The circuit of claim 1 , wherein the functional circuit is a dynamic random access memory device.