IP Library Granted Patent US 7,935,382
Granted Patent B2
US 7,935,382 · App. 11/313,528 · Granted May 3, 2011

Method for making crystalline composition

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Quick Facts
Patent No.
US 7,935,382
App. No.
11/313,528
Granted
May 3, 2011
Kind
B2
Abstract

A method of making a metal nitride is provided. The method may include introducing a metal in a chamber. A nitrogen-containing material may be flowed into the chamber. Further, a hydrogen halide may be introduced. The nitrogen-containing material may react with the metal in the chamber to form the metal nitride.

Claims (51)

1. A method, comprising:

flowing a nitrogen-containing material into a chamber defined by a housing;

providing a metal to the chamber in a crucible;

heating the chamber to a determined temperature, and pressurizing the chamber to a determined pressure;

flowing hydrogen halide to the chamber;

mixing the nitrogen-containing material and the hydrogen halide to form a mixture; and

reacting the mixture with the metal in the chamber, forming a metal nitride in the crucible that originally contained the metal.

2. The method as defined in claim 1 , wherein the metal comprises one or more of aluminum, gallium, or indium.

3. The method as defined in claim 1 , wherein the step of flowing a nitrogen-containing material comprises flowing ammonia.

4. The method as defined in claim 1 , wherein the step of reacting the nitrogen-containing material with the metal comprises forming gallium nitride.

5. The method as defined in claim 1 , wherein the step of heating the chamber comprises achieving or maintaining a temperature in the chamber that is in a range of from about 800 degree Celsius to about 1300 degree Celsius for a period of greater than about 30 minutes.

6. The method as defined in claim 1 , wherein the step of pressurizing comprises achieving or maintaining a pressure in the chamber that has at least one dimension that is greater than about 1 meter.

7. The method as defined in claim 1 , wherein the step of providing the metal comprises one or both of preloading the metal in the chamber, or flowing the metal into the chamber.

8. The method as defined in claim 1 , wherein the step of flowing a nitrogen-containing material comprises achieving a flow rate of nitrogen-containing material in a range of from about 100 cubic centimeters per minute to about 1200 cubic centimeters per minute.

9. The method as defined in claim 1 , further comprising setting a ratio of flow rate of the nitrogen-containing material to a flow rate of the hydrogen halide to be in a range of from about 1:1 to about 30:1.

10. The method as defined in claim 1 , further comprising setting a ratio of flow rate of the nitrogen-containing material to a flow rate of the hydrogen halide to be in a range of from about 1:1 to about 15:1.

11. The method as defined in claim 1 , further comprising flowing a carrier gas into the chamber.

12. The method as defined in claim 1 , further comprising flowing one or more dopant precursors into the chamber.

13. The method as defined in claim 12 , further comprising achieving or maintaining a flow rate of the dopant precursor into the chamber to be in a range of from about 100 cubic centimeters per minute to about 1200 cubic centimeters per minute.

14. The method as defined in claim 1 , further comprising evacuating the chamber.

15. The method as defined in claim 14 , further comprising achieving or maintaining a pressure within the chamber to be in a range of less than about 10 −7 millibar.

16. The method as defined in claim 1 , further comprising flowing a fluid in a pathway that is between walls of the housing, and controlling the fluid temperature to control the temperature of contents of the chamber.

17. The method as defined in claim 1 , further comprising maintaining an outlet vent temperature to be greater than about 200 degree Celsius.

18. The method as defined in claim 1 , further comprising processing the metal nitride by one or more of:

scraping, scouring or scarifying a surface of the metal nitride;

oxidizing the surface of the metal nitride in air or in a dry oxygen atmosphere; or

boiling the metal nitride in perchloric acid.

19. The method as defined in claim 18 , further comprising pulverizing the metal nitride into a plurality of seed crystals, each of the seed crystal having an average size to be in a range that is less than about 10 millimeters.

20. The method as defined in claim 19 , wherein pulverizing comprises one or more of wire sawing, ball milling, jet milling, laser cutting, or cryofracturing.

21. The method as defined in claim 1 , further comprising preparing a sputter target from the metal halide by one or both of:

trimming the metal nitride to a shape having one or more pre-determined dimensions; or

removing residual contaminants.

22. The method as defined in claim 21 , wherein the step of removing residual contaminants comprises one or more of:

washing the metal nitride in one or more of organic solvent, acid, base, or oxidizer;

sonicating the metal nitride in one or more of organic solvent, acid, base, or oxidizer; or

annealing the metal nitride in a reduced pressure environment.

23. The method as defined in claim 1 , wherein the nitrogen-containing material and hydrogen halide flows are both upstream of the metal.

24. The method as defined in claim 23 , wherein the nitrogen-containing material and the hydrogen halide pre-mix before contacting the metal.

25. A method, comprising:

flowing a nitrogen-containing gas and a halide-containing gas into a chamber defined by a housing;

mixing the nitrogen-containing gas and the halide-containing gas in the chamber to form a gas mixture;

contacting the gas mixture with a metal in the chamber; and

reacting the nitrogen-containing gas with the metal in the chamber to form a metal nitride and further comprising one or more of:

adding a dopant to a carrier gas and flowing the dopant and carrier gas into the chamber,

purifying one or more of the carrier gas, nitrogen-containing gas, or halide-containing gas immediately prior to flowing the one or more of the carrier gas, nitrogen-containing gas, or halide-containing gas into the chamber,

outgassing the chamber prior to flowing the one or more of the carrier gas, nitrogen-containing gas, or halide-containing gas into the chamber, or

spinning the one or more of the carrier gas, nitrogen-containing gas, or halide-containing gas while flowing the one or more of the carrier gas, nitrogen-containing gas, or halide-containing gas into the chamber.

26. The method as defined in claim 25 , wherein the metal is a liquid during the contacting with the gas mixture, and further comprising flowing the metal into the chamber.

27. The method as defined in claim 25 , further comprising flowing the metal into the chamber, and wherein the metal is a flowable liquid.

28. The method as defined in claim 25 , wherein mixing the nitrogen-containing gas and the halide-containing gas in the chamber to form a gas mixture comprises impinging the nitrogen-containing gas with the halide-containing gas.

29. The method as defined in claim 25 , further comprising maintaining an outlet vent temperature to be greater than about 200 degree Celsius.

Assignments (24)
RELEASE OF SECURITY INTEREST Recorded Dec 24, 2020
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS COLLATERAL AGENT
To: MOMENTIVE PERFORMANCE MATERIALS INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 11, 2020
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MOMENTIVE PERFORMANCE MATERIALS INC.; MOMENTIVE PERFORMANCE MATERIALS GMBH & CO KG; MOMENTIVE PERFORMANCE MATERIALS JAPAN HOLDINGS GK
Reel/Frame 054387/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded May 21, 2019
From: JPMORGAN CHASE BANK, N.A.
To: MOMENTIVE PERFORMANCE MATERIALS INC.
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RELEASE OF SECURITY INTEREST Recorded May 15, 2019
From: BOKF, NA
To: MOMENTIVE PERFORMANCE MATERIALS INC.
Reel/Frame 049249/0271 →
RELEASE OF SECURITY INTEREST Recorded May 15, 2019
From: BOKF, NA
To: MOMENTIVE PERFORMANCE MATERIALS INC.
Reel/Frame 049194/0085 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 23, 2017
From: SORAA, INC.
To: SLT TECHNOLOGIES, INC.
Reel/Frame 044636/0918 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2016
From: MOMENTIVE PERFORMANCE MATERIALS, INC.
To: SORAA INC.
Reel/Frame 040186/0212 →
RELEASE OF SECURITY INTEREST Recorded Jul 26, 2016
From: BOKF, NA
To: MOMENTIVE PERFORMANCE MATERIALS INC.
Reel/Frame 039263/0831 →
RELEASE OF SECURITY INTEREST Recorded Jul 26, 2016
From: JPMORGAN CHASE BANK, N.A.
To: MOMENTIVE PERFORMANCE MATERIALS INC.
Reel/Frame 039263/0177 →
RELEASE OF SECURITY INTEREST Recorded Jul 26, 2016
From: BOKF, NA
To: MOMENTIVE PERFORMANCE MATERIALS INC.
Reel/Frame 039263/0803 →
RELEASE OF SECURITY INTEREST Recorded Jul 26, 2016
From: JPMORGAN CHASE BANK, N.A.
To: MOMENTIVE PERFORMANCE MATERIALS INC.
Reel/Frame 039263/0091 →
NOTICE OF CHANGE OF COLLATERAL AGENT - ASSIGNMENT OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Mar 6, 2015
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A. AS COLLATERAL AGENT
To: BOKF, NA, AS SUCCESSOR COLLATERAL AGENT
Reel/Frame 035136/0457 →
NOTICE OF CHANGE OF COLLATERAL AGENT - ASSIGNMENT OF SECURITY INTEREST IN INTELLECTUAL PROPERTY - SECOND LIEN Recorded Mar 6, 2015
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A. AS COLLATERAL AGENT
To: BOKF, NA, AS SUCCESSOR COLLATERAL AGENT
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TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Oct 30, 2014
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TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Oct 30, 2014
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To: MOMENTIVE PERFORMANCE MATERIALS INC.
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SECURITY INTEREST Recorded Oct 27, 2014
From: MOMENTIVE PERFORMANCE MATERIALS INC.
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS COLLATERAL AGENT
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SECURITY INTEREST Recorded Oct 27, 2014
From: MOMENTIVE PERFORMANCE MATERIALS INC.
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Apr 29, 2013
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To: JPMORGAN CHASE BANK, N.A.
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PATENT SECURITY AGREEMENT Recorded Apr 3, 2013
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To: BANK OF NEW YORK MELLON TRUST COMPANY, N.A., THE
Reel/Frame 030185/0001 →
SECURITY AGREEMENT Recorded May 31, 2012
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SECURITY AGREEMENT Recorded Jul 1, 2009
From: MOMENTIVE PERFORMANCE MATERIALS, INC.; JUNIPER BOND HOLDINGS I LLC; JUNIPER BOND HOLDINGS II LLC; JUNIPER BOND HOLDINGS III LLC; JUNIPER BOND HOLDINGS IV LLC; MOMENTIVE PERFORMANCE MATERIALS CHINA SPV INC.; MOMENTIVE PERFORMANCE MATERIALS QUARTZ, INC.; MOMENTIVE PERFORMANCE MATERIALS SOUTH AMERICA INC.; MOMENTIVE PERFORMANCE MATERIALS USA INC.; MOMENTIVE PERFORMANCE MATERIALS WORLDWIDE INC.; MPM SILICONES, LLC
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2006
From: PARK, DONG-SIL; D'EVELYN, MARK PHILIP; PETERSON, MYLES STANDISH, II; LEMAN, JOHN THOMAS; HIBSHMAN, JOELL RANDOLPH, II; SHARIFI, FRED
To: GENERAL ELECTRIC COMPANY
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