Non-volatile memory cell for storage of a data item in an integrated circuit

1. A memory cell for storage of a data item in an integrated circuit, comprising:

a resistive memory element having different conductance states depending on the stored data item;

a memory unit for passing the stored data item to the integrated circuit;

a read unit configured to pass the data item on for storage in the memory unit, wherein the data item is determined as a function of the conductance state of the memory element;

a control unit configured to selectively activate the read unit, whereby the memory element is connected to the memory unit, and deactivate the read unit after storage of the data item in the memory unit, whereby the memory element is isolated from the memory unit, and wherein the memory unit comprises a first inverter and a second inverter having respective inputs connected to respective outputs of each other, wherein the first inverters emits the stored data item at its output and the second inverter emits an inverted data item which has been inverted with respect to the stored data item at its output, and wherein the memory unit stores the data item produced at the output of the first inverter.

2. The memory cell of claim 1 , wherein the control unit is configured to remove power from the memory element on deactivation of the read unit.

3. The memory cell of claim 1 , wherein the memory element comprises one of a programmable metallization cell (PMC) component and a phase changing component.

4. The memory cell of claim 1 , wherein the read unit comprises a selection transistor which is connected in series with the resistive memory element.

5. The memory cell of claim 1 , wherein the read unit produces a logic level corresponding to the conductance state of the memory element at the output of the first inverter when the read unit is activated, and wherein the data item written to the memory unit corresponds to the logic level.

6. The memory cell of claim 1 , wherein the read unit is configured to write the inverse data item produced at the output of the second inverter to the memory unit.

7. A memory cell for storage of a data item in an integrated circuit, comprising:

a resistive memory element having different conductance states depending on the stored data item, wherein the memory element is connected to a programming unit for setting a desired conductance state of the memory element corresponding to a desired data item;

a memory unit for passing the stored data item to the integrated circuit;

a read unit configured to pass the data item on for storage in the memory unit, wherein the data item is determined as a function of the conductance state of the memory element;

a control unit configured to selectively activate the read unit, whereby the memory element is connected to the memory unit, and deactivate the read unit after storage of the data item in the memory unit, whereby the memory element is isolated from the memory unit; and

a write unit for writing the desired data item to the memory unit when the read unit is deactivated.

8. The memory cell of claim 7 , wherein the programming unit is configured to set a respective conductance state, which corresponds to the data item stored in the memory unit, in the memory element as a function of a control signal.

9. A non-volatile memory cell for storage of a data item in an integrated circuit, comprising:

a first resistive memory element having a first conductance state;

a second resistive memory element having a second conductance state, wherein the second conductance state is the compliment of the first conductance state of the first resistive memory element;

a read unit connected to the first and second resistive memory elements for reading the stored data item as a function of the first and second conductance states of the first and second resistive memory elements; and

a memory unit connected to received the stored data item read-out by the read unit and for passing the stored data item to the integrated circuit,

wherein the read unit is selectively activated to read the stored data item from the first resistive memory element and pass the stored data item to the memory unit and deactivated thereafter whereby the memory element is isolated from the memory unit.

10. The memory cell of claim 9 , further comprising:

a control unit configured to selectively activate and deactivate the read unit.

11. The memory cell of claim 9 , wherein the first and second Resistive elements each comprise a programmable metallization cell (PMC) component.

12. The method of claim 9 , wherein the second resistive memory element comprises a reference resistance element having a reference resistance set between a high conductance state and a low conductance state of the first resistive memory element.

13. The memory cell of claim 9 , wherein the read unit comprises a first switching transistor and a second switching transistor respectively connected to the first and second resistive memory elements, and wherein the second resistive memory element comprises a reference resistance element which is incorporated into the second switching transistor.

14. An integrated circuit having a non-volatile memory cell for storage of a data item, comprising:

a first resistive memory element having a first conductance state corresponding to the stored data item;

a second resistive memory element having a second conductance state;

a read unit comprising a first switching transistor and a second switching transistor respectively connected to the first and second resistive memory elements for reading the stored data item as a function of the first and second conductance states of the first and second memory elements;

a memory unit comprising a first inverter and a second inverter having respective inputs and outputs connected to each other, wherein an output of the first inverter is connected via the first switching transistor to the first resistive memory element and wherein an output of the second inverter is connected via the second switching transistor to the second resistive memory element; and

a control unit configured to selectively activate the first and second switching transistors of the read unit to connect first and second resistive memory elements to the memory unit and deactivate the read unit thereafter to disconnect the first and second resistive memory elements from the memory unit.

15. The integrated circuit of claim 14 , further comprising:

a programming unit comprising a first programming transistor connected to the first resistive memory element and a second programming transistor connected to the second resistive memory element, wherein the first and second resistive memory elements are programmed to respective desired conductance states by selectively activating the first and second programming transistors.

16. The integrated circuit of claim 14 , wherein the second resistive memory element comprises a reference resistance element.

17. The integrated circuit of claim 14 , wherein the second resistive memory element comprises a reference resistance element which is incorporated into the second switching transistor.

18. The integrated circuit of claim 17 , further comprising:

a programming unit comprising a programming transistor connected to the first resistive memory element, wherein the first resistive memory element is programmed to a desired conductance state by selectively activating the programming transistor; and

a write unit connected to selectively activate the programming unit.