IP Library Granted Patent US 7,635,920
Granted Patent B2
US 7,635,920 · App. 11/360,925 · Granted Dec 22, 2009

Method and apparatus for indicating directionality in integrated circuit manufacturing

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Quick Facts
Patent No.
US 7,635,920
App. No.
11/360,925
Granted
Dec 22, 2009
Kind
B2
Abstract

An integrated circuit includes a visually discernable indicator formed as part of the integrated circuit to indicate a directionality of a non-visually discernable characteristic of the integrated circuit.

Claims (30)

1. An integrated circuit, comprising:

a visually discernable indicator formed as part of the integrated circuit to indicate a directionality of a non-visually discernable characteristic of the integrated circuit.

2. An integrated circuit as in claim 1 , further comprising:

a first device comprising a source and a drain, wherein the source of the first device comprises a first implant; and

a second device comprising a source and a drain, wherein the source of the second device comprises a second implant,

wherein a first implant direction used to form the first implant is different than a second implant direction used to form the second implant.

3. An integrated circuit as in claim 1 , wherein the non-visually discernable characteristic comprises an implant direction of an implant.

4. An integrated circuit as in claim 3 , wherein the implant comprises a halo implant.

5. An integrated circuit as in claim 1 , wherein the non-visually discernable characteristic comprises a crystal lattice orientation.

6. An integrated circuit as in claim 1 , wherein the non-visually discernable characteristic is discerned during manufacture of the integrated circuit.

7. An integrated circuit as in claim 1 , wherein the visually discernable indicator comprises:

a first portion used during design of the integrated circuit; and

a second portion used during manufacture of the integrated circuit.

8. An integrated circuit as in claim 7 , wherein the first portion of the visually discernable indicator is used during a design rule verification process.

9. An integrated circuit as in claim 7 , wherein the second portion of the visually discernable indicator comprises a function indicator and a direction indicator.

10. An integrated circuit of claim 1 , wherein the visually discernable indicator is formed in an IP block.

11. An integrated circuit of claim 1 , wherein the visually discernable indicator is formed using a mask while forming the integrated circuit.

12. An integrated circuit formed using at least one implant, the integrated circuit comprising:

a visually discernable indicator which indicates a direction of the at least one implant from visual inspection.

13. An integrated circuit as in claim 12 , wherein the at least one implant comprises a halo implant for a source region.

14. An integrated circuit as in claim 12 , wherein the visually discernable indicator comprises: a first portion used during design of the integrated circuit; and a second portion used during manufacture of the integrated circuit.

15. An integrated circuit as in claim 14 , wherein the second portion of the visually discernable indicator comprises a function indicator and a direction indicator.

16. An integrated circuit of claim 12 , wherein the visually discernable indicator is formed in an IP block.

17. An integrated circuit of claim 16 , wherein the visually discernable indicator is formed using a mask while forming the integrated circuit.

18. An integrated circuit, comprising:

at least one indicator to indicate an implant direction of a source halo implant; and

an asymmetrically doped device comprising a source region and a drain region, wherein the source region comprises a source halo implant region, and

wherein the source halo implant region of the asymmetrically doped device has a higher dopant concentration than a region adjacent the drain region, wherein the region adjacent the drain region has a same conductivity type as the source halo implant region.

19. An integrated circuit of claim 18 , wherein the at least one indicator is formed in an P block.

20. An integrated circuit of claim 18 , wherein the at least one indicator is formed using a mask while forming the integrated circuit.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037355/0723 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →