IP Library Granted Patent US 7,397,128
Granted Patent B2
US 7,397,128 · App. 11/392,802 · Granted Jul 8, 2008

Semiconductor device and method of manufacturing the same

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Quick Facts
Patent No.
US 7,397,128
App. No.
11/392,802
Granted
Jul 8, 2008
Kind
B2
Abstract

Disclosed is a semiconductor device in which emitter pad electrodes connected to an active region, collector and base pad electrodes are formed on a surface of a semiconductor substrate. Furthermore, on a back surface of the semiconductor substrate, a backside electrode is formed. Moreover, the emitter pad electrodes connected to a grounding potential are connected to the backside electrode through feedthrough electrodes penetrating the semiconductor substrate in a thickness direction.

Claims (14)

1. A semiconductor device, comprising:

a semiconductor substrate including a front surface, a back surface and four lateral faces, which connect a periphery of the front surface and a periphery of the back surface;

a diffusion region in the semiconductor substrate;

a pad electrode on the front surface of the semiconductor substrate, which is electrically connected to the diffusion region;

a backside electrode on the back surface of the semiconductor substrate;

a through-hole penetrating through the semiconductor substrate and located under the pad electrode;

a feedthrough electrode, which electrically connects the pad electrode and the backside electrode through the semiconductor substrate and which is formed of a conductive material covering an inner wall of the through-hole or filled in the through-hole, and wherein

the diffusion region is surrounded by an isolation region;

the pad electrode is outside of the isolation region; and

the diffusion region and the pad electrode are connected through a wiring.

2. The semiconductor device according to claim 1 , wherein the diffusion region is a first region for passing through principal current, a second region for passing through principal current, or a control region for passing through a control signal.

3. The semiconductor device according to claim 1 , including two feedthrough electrodes that correspond to two pad electrodes and the two feedthrough electrodes are connected to the backside electrode.

4. The semiconductor device according to claim 1 , wherein the diffusion region is connected through a plurality of pad electrodes and feedthrough electrodes to the backside electrode, which is grounded.

5. The semiconductor device according to claim 1 , wherein the diffusion region is a diffusion region of a transistor, a diode, an IC, or a LSI.

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2014
From: KANTO SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 033713/0296 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →