IP Library Granted Patent US 7,646,091
Granted Patent B2
US 7,646,091 · App. 11/399,723 · Granted Jan 12, 2010

Semiconductor package and method using isolated V

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Quick Facts
Patent No.
US 7,646,091
App. No.
11/399,723
Granted
Jan 12, 2010
Kind
B2
Abstract

Embodiments of the invention include a semiconductor integrated circuit package that includes a substrate which can have an integrated circuit die attached thereto. The package includes a dedicated high-speed ground plane that is electrically isolated from the ground plane used to ground the low speed circuitry of the package.

Claims (57)

1. A semiconductor integrated circuit (IC) package which comprises:

a substrate having a first surface and a second surface wherein;

a first layer of the substrate includes,

a first ground plane enabling electrical connection with low speed electronic circuitry, and

a second ground plane that is spatially separated and electrically isolated from the first ground plane, the second ground plane enabling electrical connection with high speed electronic circuitry;

a second layer of the substrate includes,

a third ground plane configured for electrical connection with low speed electronic circuitry, and

a fourth ground plane that is spatially separated and electrically isolated from the third ground plane, the third ground plane configured for electrical connection with high speed electronic circuitry;

a plurality of electrical connections that electrically connect the first ground plane with solder balls mounted on the second surface of the substrate;

a plurality of additional electrical connections that electrically connect the second ground plane with solder balls mounted on the second surface of the substrate; and

peripheral electrical contacts arranged on the substrate and configured for connection with electronic circuitry external to the package; and

at least one reference plane associated with each layer of the substrate and the ground planes included thereon.

2. An IC package as recited in claim 1 wherein the peripheral electrical contacts include,

a first set of electrical contacts for electrical connection with low speed electronic circuitry; and

a second set of electrical contacts for electrical connection with high speed electronic circuitry; and

wherein the second set of electrical contacts are spaced apart at a distance that is at least twice as far apart as the spacing for the first set of electrical contacts.

3. An IC package as recited in claim 2 wherein the first set of electrical contacts are spaced apart a distance of at least 70 μm (micrometers) and wherein the second set of electrical are spaced apart a distance of at least 140 μm (micrometers).

4. An IC package as recited in claim 2 wherein the first set of electrical contacts are spaced apart a distance of at least 70 μm (micrometers) and wherein the second set of electrical are spaced apart a distance of at least 200 μm (micrometers).

5. An IC package as recited in claim 1 wherein the low speed electronic circuitry is defined as circuitry having serial transfer rates of less than about 1 Gigabits per second (Gb/s); and

wherein the high speed electronic circuitry is defined as circuitry having serial transfer rates of greater than about 1 Gb/s.

6. An IC package as recited in claim 1 wherein the high speed electronic circuitry is defined as circuitry having serial transfer rates of greater than about 8.5 Gb/s.

7. An IC package as recited in claim 1 wherein the peripheral electrical contacts include,

a first set of electrical contacts for electrical connection with low speed electronic circuitry; and

a second set of electrical contacts for electrical connection with high speed electronic circuitry; and

wherein the second set of electrical contacts are spaced apart at a distance that is at least three times as far apart as the spacing for the first set of electrical contacts.

8. An IC package as recited in claim 1 wherein the peripheral electrical contacts include,

a first set of electrical contacts for electrical connection with low speed electronic circuitry; and

a second set of electrical contacts for electrical connection with high speed electronic circuitry; and

wherein the second set of electrical contacts are spaced apart at a distance sufficient to establish a differential impedance of at least 100 ohms (Ω) between the contacts of the second set.

9. An IC package as recited in claim 1 wherein the peripheral electrical contacts include,

a first set of electrical contacts for electrical connection with low speed electronic circuitry; and

a second set of electrical contacts for electrical connection with high speed electronic circuitry; and

wherein the electrical contacts are arranged such that,

the first spacing between the contacts of the first set of electrical contacts is smaller than a second spacing between the contacts of the second set of electrical contacts, thereby enabling greater contact density for the first set of electrical contacts.

10. An IC package as recited in claim 1 wherein the peripheral electrical contacts include,

a first set of electrical contacts for electrical connection with low speed electronic circuitry; and

a second set of electrical contacts for electrical connection with high speed electronic circuitry; and

wherein the electrical contacts are arranged as part of I/O lines such that,

a first spacing between the contacts of the first set of electrical contacts is sufficient to establish a control differential impedance of at least 50Ω between the contacts of the first set of electrical contacts to substantially eliminate cross-talk between I/O lines for the low speed electronic circuitry; and

a second spacing between the contacts of the second set of electrical contacts is sufficient to establish a control differential impedance of at least 100Ω between the contacts of the second set of electrical contacts to substantially eliminate cross-talk between I/O lines for the high speed electronic circuitry.

11. An IC package as recited in claim 1 wherein the peripheral electrical contacts include,

a first set of electrical contacts for electrical connection with low speed electronic circuitry; and

a second set of electrical contacts for electrical connection with high speed electronic circuitry; and

wherein the electrical contacts are arranged such that,

a first spacing between the contacts of the first set of electrical contacts is sufficient to establish a control differential impedance of at least 50Ω between the contacts of the first set of electrical contacts; and

a second spacing between the contacts of the second set of electrical contacts is sufficient to establish a control differential impedance of at least 100Ω between the contacts of the second set of electrical contacts.

12. An IC package as recited in claim 1 wherein the first surface includes a die attachment surface with a die arrangement attached thereto,

the die arrangement being electrically connected to the first ground plane, the second ground plane, and the peripheral electrical contacts of the substrate.

13. An IC package as recited in claim 12 wherein the die arrangement comprises a die having both high-speed electronic circuitry and low-speed electronic circuitry; and

wherein the peripheral electrical contacts include,

a first set of electrical contacts for electrical connection with low speed electronic circuitry; and

a second set of electrical contacts for electrical connection with high speed electronic circuitry; and

wherein the low-speed electronic circuitry is connected with the first ground plane and is electrically connected with the first set of electrical contacts that are spaced for connection with the low speed electronic circuitry; and

wherein the high-speed electronic circuitry is connected with the second ground plane and is electrically connected with the second set of electrical contacts that are spaced for connection with the high speed electronic circuitry.

14. An IC package as recited in claim 13 wherein the die arrangement comprises a stacked die arrangement wherein at least one die has high-speed electronic circuitry and wherein at least one die has low-speed electronic circuitry;

wherein the low-speed electronic circuitry is connected with the first ground plane and is electrically connected with the first set of electrical contacts that are spaced for connection with the low speed electronic circuitry; and

wherein the high-speed electronic circuitry is connected with the second ground plane and is electrically connected with the second set of electrical contacts that are spaced for connection with the high speed electronic circuitry.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059723/0382 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044886/0766 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
CHANGE OF NAME Recorded Jun 6, 2014
From: LSI LOGIC CORPORATION
To: LSI CORPORATION
Reel/Frame 033102/0270 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2006
From: OTHIENO, MAURICE; CHIA, CHOK J.; AMIN, AMAR J.
To: LSI LOGIC CORPORATION
Reel/Frame 017775/0366 →