IP Library Patent Application 11400125
Patent Application
App. No. 11/400,125

System and method for cleaning semiconductor fabrication equipment parts

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Quick Facts
Patent No.
US None
App. No.
11/400,125
Abstract

An exemplary embodiment discloses a process for cleaning semiconductor fabrication equipment parts with non-metallic surfaces. The process optionally includes providing a semiconductor fabrication part with a non-metallic surface to be cleaned and applying a dilute aqueous solution to remove contamination from the non-metallic surface. The aqueous solution optionally includes dilute amounts of hydrofluoric acid, nitric acid and hydrogen peroxide. The dilute amounts would optionally be in the ranges of 0.5-1.5% wt. hydrofluoric acid, 0.1-0.5%wt. nitric acid and 1-10%wt. hydrogen peroxide.

Claims (13)

1 . A cleaning process for parts comprising:

providing a part with a non-metallic surface to be cleaned;

applying a dilute aqueous solution to remove contamination from the non-metallic surface wherein the solution consists of 0.5-1.5% wt. hydrofluoric acid, 0.1-0.5% wt. nitric acid and 1-10% wt. hydrogen peroxide.

2 . The process as recited in claim 1 wherein the concentration of H 2 O 2 is no greater than about 5% wt.

3 . The process of claim 1 wherein said dilute aqueous solution comprises 1.25 weight percent hydrofluoric acid 3.0 weight percent hydrogen peroxide, and 0.125 weight percent nitric acid.

4 . The process of claim 1 wherein said part is formed of a material selected from the group consisting of silicon oxide (quartz), ceramics, polysilicon and silicon.

5 . The process of claim 4 wherein said part is formed from a ceramic selected from the group consisting of aluminum oxide and aluminum nitride.

6 . The process of claim 1 further comprising:

rinsing the part; and

drying the part.

7 . The process of claim 1 wherein said part is a semiconductor fabrication part.

8 . The process of claim 7 wherein said part is formed of material selected from the group consisting of silicon oxide (quartz), silicon, polysilicon and ceramics.

9 . The process of claim 8 wherein said part is formed from a ceramic selected from the group consisting of aluminum oxide, aluminum nitride and silicon carbide.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Aug 28, 2018
From: UNIVEST BANK AND TRUST CO., SUCCESSOR BY MERGER TO FOX CHASE BANK
To: QUANTUM GLOBAL TECHNOLOGIES, LLC
Reel/Frame 046962/0614 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 12, 2011
From: APPLIED MATERIALS, INC.
To: QUANTUM GLOBAL TECHNOLOGIES LLC
Reel/Frame 026886/0171 →
SECURITY AGREEMENT Recorded Jun 21, 2011
From: QUANTUM GLOBAL TECHNOLOGIES, LLC
To: FOX CHASE BANK
Reel/Frame 026468/0130 →
MERGER Recorded May 6, 2010
From: CHEMTRACE PRECISION CLEANING INC.
To: METRON TECHNOLOGY DISTRIBUTION CORPORATION
Reel/Frame 024349/0776 →
MERGER Recorded May 6, 2010
From: METRON TECHNOLOGY DISTRIBUTION CORPORATION
To: METRON TECHNOLOGY CORPORATION
Reel/Frame 024349/0801 →
MERGER Recorded May 6, 2010
From: METRON TECHNOLOGY CORPORATION
To: APPLIED MATERIALS, INC.
Reel/Frame 024349/0814 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2010
From: TAN, SAMANTHA
To: CHEMTRACE CORPORATION
Reel/Frame 024349/0750 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2010
From: CHEMTRACE CORPORATION
To: CHEMTRACE PRECISION CLEANING, INC.
Reel/Frame 024349/0760 →