IP Library Granted Patent US 7,678,255
Granted Patent B2
US 7,678,255 · App. 11/419,128 · Granted Mar 16, 2010

Mask and method for electrokinetic deposition and patterning process on substrates

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Quick Facts
Patent No.
US 7,678,255
App. No.
11/419,128
Granted
Mar 16, 2010
Kind
B2
Abstract

A mask for application to a substrate to facilitate electrokinetic deposition of charged particles onto the substrate, the mask comprising a conducting layer, a dielectric layer, and mask openings. A method for applying a pattern of charged particles to a substrate comprising applying the foregoing the substrate to yield a masked substrate; immersing the masked substrate in a bath containing the charged particles; and establishing an electrical potential between the conducting layer of the mask and a counter-electrode thereby electrokinetically depositing the particles through the mask openings onto areas of the substrate exposed in the mask openings. Products made by this method.

Claims (25)

1. A method for applying a pattern of charged particles to a substrate comprising:

applying a mask having a conducting layer, a dielectric layer, and mask openings to the substrate with the conducting layer of the mask between the substrate and the dielectric layer to yield a masked substrate having unmasked surfaces defined by the mask openings;

immersing the masked substrate in a bath containing the charged particles; and

establishing an electrical potential between the conducting layer of the mask and a counter-electrode thereby electrokinetically attracting the charged particles to exposed surfaces on the conducting layer in the mask openings to deposit the charged particles in the mask openings.

2. The method of claim 1 wherein the mask openings into which charged particles are deposited include mask openings which define unmasked surfaces which are non-conductive surfaces of the substrate.

3. The method of claim 1 wherein all surfaces of the substrate are non-conductive.

4. The method of claim 1 wherein the charged particles are powder particles having an average size between about 2 and about 100 microns.

5. The method of claim 1 wherein the charged particles have an average size between about 50 and about 500 microns.

6. The method of claim 1 wherein the charged particles have an average size between about 300 microns and about 1 mm.

7. The method of claim 1 wherein the charged particles are Sn-based particles.

8. The method of claim 1 wherein the charged particles are made from materials selected from among the metals and alloys Sn, Sn/Pb, Sn/Ag/Cu, Sn/Ag, Cu, Sn/Ag/Bi, Sn/Bi, and Sn/Pb/Bi.

9. The method of claim 1 wherein the conducting layer has a thickness between about 50 microns and about 1 cm and the dielectric layer has a thickness between about 1 and about 250 microns.

10. A method for applying a pattern of charged particles to a non-conductive substrate comprising:

applying a mask having a conducting layer, a dielectric layer, and mask openings to the substrate to with the conducting layer of the mask between the substrate and the dielectric layer to yield a masked substrate having unmasked surfaces defined by the mask openings;

immersing the masked substrate in a bath containing the charged particles; and

establishing an electrical potential between the conducting layer of the mask and a counter-electrode thereby electrokinetically attracting the charged particles to exposed surfaces on the conducting layer in the mask openings to deposit the charged particles in the mask openings.

11. The method of claim 10 wherein the charged particles are powder particles having an average size between about 2 and about 100 microns.

12. The method of claim 10 wherein the charged particles have an average size between about 50 and about 500 microns.

13. The method of claim 10 wherein the charged particles have an average size between about 300 microns and about 1 mm.

14. The method of claim 10 wherein the charged particles are Sn-based particles.

15. The method of claim 10 wherein the charged particles are made from materials selected from among the metals and alloys Sn, Sn/Pb, Sn/Ag/Cu, Sn/Ag, Cu, Sn/Ag/Bi, Sn/Bi, and Sn/Pb/Bi.

16. A method for applying a pattern of charged particles to a substrate comprising:

applying a mask to the substrate to yield a masked substrate comprising an electrically conducting layer, a dielectric layer adhered to the conducting layer, and mask openings which define a pattern for deposition of the charged particles onto the substrate;

immersing the masked substrate in a bath containing the charged particles; and

establishing an electrical potential between the conducting layer of the mask and a counter-electrode thereby electrokinetically depositing the particles through the mask openings onto areas of the substrate exposed in said mask openings.

Assignments (7)
ASSIGNMENT OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Nov 17, 2022
From: BARCLAYS BANK PLC
To: CITIBANK, N.A.
Reel/Frame 061956/0643 →
CHANGE OF NAME Recorded Feb 19, 2019
From: ALPHA METALS, INC.
To: ALPHA ASSEMBLY SOLUTIONS INC.
Reel/Frame 048373/0054 →
SECURITY INTEREST Recorded Feb 5, 2019
From: ALPHA ASSEMBLY SOLUTIONS INC. (F/K/A ALPHA METALS, INC.)
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 048260/0683 →
RELEASE OF SECURITY INTEREST Recorded Feb 4, 2019
From: BARCLAYS BANK PLC, AS COLLATERAL AGENT
To: ALPHA ASSEMBLY SOLUTIONS INC. (F/K/A ALPHA METALS, INC.)
Reel/Frame 048232/0849 →
PATENT SECURITY AGREEMENT Recorded Apr 15, 2016
From: ALPHA METALS, INC.
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 038439/0590 →
CHANGE OF NAME Recorded Mar 17, 2016
From: FRY'S METALS INC.
To: ALPHA METALS, INC.
Reel/Frame 038144/0984 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2006
From: KHASELEV, OSCAR; LEWIS, BRIAN G.; MARCZI, MICHAEL; SINGH, BAWA
To: FRY'S METALS, INC.
Reel/Frame 017784/0417 →