IP Library Granted Patent US 7,333,040
Granted Patent B1
US 7,333,040 · App. 11/443,680 · Granted Feb 19, 2008

Flash ADC with sparse codes matched to input noise

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,333,040
App. No.
11/443,680
Granted
Feb 19, 2008
Kind
B1
Abstract

An analog-to-digital converter (ADC) architecture to implement a non-linear flash ADC. The apparatus includes a non-linear resistor, a non-linear comparator, and an inverse non-linear encoder. The non-linear resistor has an input and a plurality of non-linear voltage outputs. The non-linear comparator ladder is coupled to the plurality of non-linear voltage outputs of the non-linear resistor. The non-linear comparator ladder includes a bank of comparators to compare an input signal to each of a plurality of non-linear voltage signals corresponding to the plurality of non-linear voltage outputs. The inverse non-linear encoder is coupled to the non-linear comparator ladder. The inverse non-linear encoder generates a digital output code based on the input signal and the plurality of non-linear voltage signals.

Claims (31)

1. An apparatus, comprising:

a non-linear resistance ladder having an input and a plurality of non-linear voltage outputs, the non-linear resistance ladder having a single discrete geometry with multiple portions of distinct resistance;

a non-linear comparator ladder coupled to the plurality of non-linear voltage outputs of the non-linear resistance ladder, wherein the non-linear comparator ladder comprises a bank of comparators to compare an input signal to each of a plurality of non-linear voltage signals corresponding to the plurality of non-linear voltage outputs; and

an inverse non-linear encoder coupled to the non-linear comparator ladder to generate a digital output code based on the input signal and the plurality of non-linear voltage signals.

2. The apparatus of claim 1 , wherein the inverse non-linear encoder comprises a binary encoder.

3. The apparatus of claim 1 , wherein the inverse non-linear encoder comprises a Gray code encoder and a Gray-to-binary code converter.

4. The apparatus of claim 1 , further comprising first and second voltage inputs coupled to the non-linear resistance ladder to generate the plurality of non-linear voltage signals, wherein the input signal comprises an image sensor readout voltage, and a plurality of comparator output signals comprise a non-linear thermometer code.

5. The apparatus of claim 4 , wherein the digital output signal of the inverse non-linear encoder comprises a digital representation of the non-linear thermometer code.

6. The apparatus of claim 1 , further comprising a bank of preamplifiers coupled between the non-linear resistor and the non-linear comparator ladder.

7. The apparatus of claim 6 , wherein the bank of comparators, the bank of preamplifiers, and the inverse non-linear encoder share a common clock signal.

8. The apparatus of claim 1 , wherein the apparatus comprises an analog-to-digital converter flash architecture.

9. An apparatus, comprising:

a non-linear resistance ladder having an input and a plurality of non-linear voltage outputs;

a non-linear comparator ladder coupled to the plurality of non-linear voltage outputs of the non-linear resistance ladder, wherein the non-linear comparator ladder comprises a bank of comparators to compare an input signal to each of a plurality of non-linear voltage signals corresponding to the plurality of non-linear voltage outputs; and

an inverse non-linear encoder coupled to the non-linear comparator ladder to generate a digital output code based on the input signal and the plurality of non-linear voltage signals, wherein a code density of the digital output code is approximately matched to noise properties of the input signal, the noise properties characterizing a low noise amplitude associated with a dark part of an image and a high noise amplitude associated with a light part of the image.

10. An apparatus, comprising:

a non-linear resistance ladder having an input and a plurality of non-linear voltage outputs;

a non-linear comparator ladder coupled to the plurality of non-linear voltage outputs of the non-linear resistance ladder, wherein the non-linear comparator ladder comprises a bank of comparators to compare an input signal to each of a plurality of non-linear voltage signals corresponding to the plurality of non-linear voltage outputs;

an inverse non-linear encoder coupled to the non-linear comparator ladder to generate a digital output code based on the input signal and the plurality of non-linear voltage signals;

a bank of preamplifiers coupled between the non-linear resistor and the non-linear comparator ladder, wherein the bank of comparators, the bank of preamplifiers, and the inverse non-linear encoder share a common clock signal; and

an error correction block coupled between the non-linear comparator ladder and the inverse non-linear encoder.

11. The apparatus of claim 10 , further comprising:

a reference buffer coupled to the non-linear comparator ladder; and

a bias voltage source coupled to the bank of preamplifiers and the non-linear comparator ladder.

12. A method, comprising:

receiving an input signal associated with an image sensor readout;

comparing the input signal with each of a plurality of non-linear voltage signals;

generating a digital output code based on the input signal and the plurality of non-linear voltage signals; and

generating the plurality of non-linear voltage signals from a non-linear resistance ladder, wherein the plurality of non-linear voltage signals comprise a dithered subset of a plurality of linear voltage steps equally distributed over a voltage range.

13. The method of claim 12 , further comprising generating a non-linear thermometer code based on the comparison of the input signal with each of the plurality of non-linear voltage signals.

14. The method of claim 12 , wherein a voltage difference between consecutive voltage signals of the plurality of non-linear voltage signals is greater than a noise component of the input signal.

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 26, 2012
From: ON SEMICONDUCTOR TRADING, LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 028447/0926 →
CONFIRMATORY ASSIGNMENT Recorded Mar 23, 2011
From: CYPRESS SEMICONDUCTOR CORPORATION
To: ON SEMICONDUCTOR TRADING LTD.
Reel/Frame 026004/0167 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2006
From: DIERICKX, BART; LEPAGE, GERALD; GEURTS, TOMAS
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 018311/0220 →