Patent Assignment
Reel/Frame 028447/0926
Assignment of Assignor's Interest
Recorded: 2012-06-26
Received: 2012-06-26
Pages: 14
Assignor
ON SEMICONDUCTOR TRADING, LTD.
Executed: 2012-06-04
Assignee
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
5005 E. MCDOWELL ROAD, PHOENIX, AZ, 85008, UNITED STATES
Covered Properties
(47)
Method for Forming Image Sensor with Shield Structures
Application:
13/227,376 →
Sensor Circuit
Application:
13/196,556 →
Method for Manufacturing a Pixel Sensing Circuit
Application:
13/117,581 →
In-Pixel Correlated Double Sampling Pixel
Application:
12/766,798 →
Sensor Circuit
Application:
12/501,811 →
Image Sensor with Shared Node
Application:
12/468,581 →
Pixel Sensing Circuit
Application:
12/413,557 →
Method for Correcting Image Sensor Control Circuitry Having Faulty Output Values and Structure Therefor
Application:
12/257,312 →
Image Sensor and Method
Application:
12/251,414 →
Correlated Double Sampling Pixel and Method
Application:
12/284,901 →
Active Pixel with Precharging Circuit
Application:
12/284,491 →
Bus Driving in an Image Sensor
Application:
12/156,351 →
Six Transistor (6T) Pixel Architecture
Application:
12/148,915 →
Method and Apparatus for Frequency Modulating a Periodic Signal of Varying Duty Cycle
Application:
12/074,459 →
Configurable Demodulator and Demodulation Method
Application:
12/028,292 →
Usb System with Spread Spectrum Emi Reduction
Application:
11/881,416 →
Method and System for Managing Physiological System
Application:
11/724,642 →
Method and Apparatus for Triggering Image Acquisition in Radiography
Application:
11/701,123 →
White Balance Correction Using Illuminant Estimation
Application:
11/639,772 →
Decryption Key Table Access Control on Asic or Assp
Application:
11/585,241 →
Image Sensor with a Reflective Waveguide
Application:
11/509,480 →
Adc with Dynamic Range Extension
Application:
11/499,671 →
Modulo Arithmetic
Application:
11/488,663 →
Non-Planar Packaging of Image Sensor
Application:
11/477,067 →
Flash Adc with Sparse Codes Matched to Input Noise
Application:
11/443,680 →
Operation Controlling
Application:
11/413,175 →
Cross Talk Reduction
Application:
11/392,410 →
Listening Device
Application:
11/375,031 →
Pixel Structure
Application:
11/366,926 →
Well Region with Rounded Corners
Application:
11/349,786 →
Pixel Having an Oxide Layer with Step Region
Application:
11/350,298 →
Photodiode Having Extended Well Region
Application:
11/350,296 →
Highest Supply Selection Circuit
Application:
11/296,777 →
Method and System for Physiological Signal Processing
Application:
11/174,366 →
Method and System for Active Noise Cancellation
Application:
11/173,355 →
Method and Pixel for Performing Correlated Double Sampling
Application:
11/136,545 →
Method and Apparatus for Frequency Modulating a Periodic Signal of Varying Duty Cycle
Application:
11/115,550 →
Defect Pixel Correction in an Image Sensor
Application:
11/111,287 →
Minimizing the Effect of Directly Converted X-Rays in X-Ray Imagers
Application:
11/089,737 →
Spread Spectrum Controllable Delay Clock Buffer with Zero Cycle Slip
Application:
10/831,017 →
Gated N-Well/P-Substrate Photodiode
Application:
10/752,845 →
Cmos Active Pixel with Hard and Soft Reset
Application:
10/752,131 →
Cmos Active Pixel with Hard and Soft Reset
Application:
10/752,197 →
Cmos Active Pixel with Hard and Soft Reset
Application:
10/752,112 →
Cmos Pixel Design for Minimization of Defect-Induced Leakage Current
Application:
10/244,723 →
Impedance Emulator
Application:
10/082,016 →
Method and Apparatus for Detection and Control of Spread Spectrum Emi Reduction
Application:
09/950,225 →