Sensor circuit

1. A method of measuring signals related to a sensor device, said method comprising:

measuring a nominal reset voltage value of said sensor device;

asserting a first knee point voltage to a photodiode of said sensor device, wherein said first knee point voltage resets a voltage on said photodiode to said first knee point voltage when the voltage of said photodiode is below said first knee point voltage;

measuring an output voltage associated with said photodiode at an end of an integration period;

subsequent to said integration period, asserting a second knee point voltage to said photodiode, wherein said second knee point voltage has a value approximately equal to a value of said first knee point voltage; and

measuring a voltage value of said photodiode in response to said asserted second knee point voltage; and

reporting said nominal reset voltage value, said output voltage, and said voltage value of said photodiode in response to said second knee point voltage.

2. The method as described in claim 1 , wherein said measuring said nominal reset voltage value comprises:

resetting a capacitor of said sensor device; and

collecting and measuring a first charge on said capacitor just after said resetting.

3. The method as described in claim 1 further comprising:

subsequent to said measuring said output voltage and prior to said asserting said second knee point voltage, initializing said photodiode to a predetermined voltage value.

4. The method as described in claim 1 , wherein said first knee point voltage is asserted at a predetermined time after a start of said integration period and prior to the end of said integration period.

5. The method as described in claim 1 , wherein said measuring said voltage value of said photodiode in response to said asserted second knee pint voltage comprises:

resetting a capacitor of said sensor device;

subsequent to said measuring said output voltage and prior to said asserting said second knee point voltage, initializing said photodiode to a predetermined voltage value;

subsequent to said asserting said second knee point voltage, collecting a charge on said capacitor; and

measuring said collected charge on said capacitor.

6. The method as described in claim 1 , wherein said measuring said output voltage comprises:

resetting a capacitor of said sensor device;

transferring a charge from said photodiode to said capacitor after said integration period;

collecting said charge on said capacitor; and

measuring said collected charge on said capacitor, wherein said collected charge is related to a voltage associated with said photodiode at the end of said integration period and as effected by said first knee point voltage asserted thereto.

7. The method as described in claim 1 further comprising:

storing in a memory said nominal reset voltage value, said output voltage and said voltage value of said photodiode in response to said asserted second knee point voltage.

8. A method of calculating a corrected data value for a sensor circuit, said method comprising:

accessing a nominal reset voltage value, wherein said nominal reset voltage value is a first charge collected on a capacitor of said sensor circuit just after reset thereof;

accessing an output voltage value associated with said photodiode at an end of an integration period of a photodiode of said sensor circuit, wherein a first knee point voltage is asserted, during said integration time, to said photodiode which resets a voltage on said photodiode to said first knee point voltage when said photodiode voltage is below said first knee point voltage;

measuring a voltage value of said photodiode corresponding to a second knee point voltage, wherein said second knee point voltage is approximately equal to said first knee point voltage;

determining said corrected data value to be said nominal reset voltage minus said output voltage value when said nominal reset voltage value minus said output voltage value, divided by a gain, is greater than said nominal reset voltage value minus said voltage value of said photodiode; and

determining said corrected data value to be said voltage value of said photodiode minus said output voltage value, multiplied by said gain, plus said nominal voltage value minus said voltage value of said photodiode when said nominal reset voltage value minus said output voltage value, divided by said gain, is less than said nominal reset voltage value minus said voltage value of said photodiode.

9. The method as described in claim 8 , wherein said output voltage value is determined by measuring a second charge collected on said capacitor at the end of said integration period and as affected by said first knee point voltage asserted, wherein said second charge is transferred from said photodiode to said capacitor.

10. The method as described in claim 8 , wherein measuring said voltage value of said photodiode corresponding to a second knee point voltage comprises:

resetting said capacitor;

initializing said photodiode to a predetermined voltage value;

subsequent to asserting said second knee point voltage, collecting a second charge on said capacitor, wherein said second charge is a charge associated with said second knee point voltage; and

measuring said collected second charge on said capacitor.

11. The method as described in claim 8 , wherein said gain is a ratio of a duration of said integration period to an elapsed time from application of said first knee point voltage to the end of said integration time.

12. The method as described in claim 8 , wherein said first knee point voltage is asserted prior to the end of said integration period, and wherein said first knee point voltage is asserted at a predetermined time after said integration period starts and before said integration period ends.

13. The method as described in claim 8 , wherein said accessing said nominal reset voltage value comprises:

resetting said capacitor; and

collecting and measuring said first charge on said capacitor just after reset thereof.

14. The method as described in claim 8 further comprising:

storing said corrected data value in a memory and associating said corrected data value with said sensor circuit.

15. A process to measure and correct signals related to a photodiode based sensor, the process configured to:

measure a nominal reset voltage value of said sensor:

assert a first knee point voltage to a photodiode of said sensor, wherein said first knee point voltage resets a voltage on said photodiode to said first knee point voltage when said photodiode voltage is below said first knee point voltage;

measure an output voltage associated with said photodiode at an end of an integration period of said photodiode;

subsequent to the end of said integration period, assert a second knee point voltage to said photodiode, wherein said second knee point voltage has a value approximately equal to a value of said first knee point voltage;

measure a voltage value of said photodiode in response to said asserted second knee point voltage;

determine a corrected data value to be said nominal reset voltage minus said output voltage value when said nominal reset voltage value minus said output voltage value, divided by a gain, is greater than said nominal reset voltage value minus said voltage value of said photodiode; and

determine said corrected data value to be said voltage value of said photodiode minus said output voltage value, multiplied by said gain, plus said nominal voltage value minus said voltage value of said photodiode when said nominal reset voltage value minus said output voltage value, divided by said gain, is less than said nominal reset voltage value minus said voltage value of said photodiode.

16. A process as described in claim 15 , wherein said measuring said nominal reset voltage value comprises:

resetting a capacitor of said sensor; and

collecting and measuring a first charge on said capacitor just after reset thereof.

17. The process as described in claim 15 , wherein said measuring said output voltage comprises:

resetting a capacitor of said sensor;

transferring a charge from said photodiode to said capacitor after said integration period; and

measuring said collected charge on said capacitor, wherein said collected charge is related to said voltage associated with said photodiode at the end of said integration period and as affected by said first knee point voltage asserted thereto.

18. The process as described in claim 15 , wherein said gain is a ratio of a duration of said integration period to an elapsed time from application of said first knee point voltage to the end of said integration time.

19. The process as described in claim 15 further comprising:

storing in a memory said nominal reset voltage value, said output voltage and said voltage value of said photodiode in response to said asserted second knee point voltage.

20. The process as described in claim 15 further comprising:

storing said corrected data value in a memory.

21. The process as described in claim 15 , wherein said first knee point voltage is asserted at a predetermined time after a start of said integration period and prior to the end of said integration period, and wherein said second knee pint voltage is asserted after the end of said integration period.